A combined segmented anode gas ionization chamber and time-of-flight detector for heavy ion elastic recoil detection analysis

2016 ◽  
Vol 87 (10) ◽  
pp. 103303 ◽  
Author(s):  
Petter Ström ◽  
Per Petersson ◽  
Marek Rubel ◽  
Göran Possnert
Keyword(s):  
Ionization Chamber ◽  
Time Of Flight ◽  
Heavy Ion ◽  
Elastic Recoil ◽  
Elastic Recoil Detection Analysis ◽  
Elastic Recoil Detection ◽  
Detection Analysis ◽  
Gas Ionization

Light element analysis in steel by high–energy heavy–ion time of flight elastic recoil detection analysis

1999 ◽  
Vol 54 (1) ◽  
pp. 151-157
Author(s):  
Wan Hong ◽  
Shinjiro Hayakawa ◽  
Kuniko Maeda ◽  
Shigekazu Fukuda ◽  
Yohichi Gohshi
Keyword(s):  
Time Of Flight ◽  
Light Element ◽  
Heavy Ion ◽  
High Energy ◽  
Elastic Recoil ◽  
Elastic Recoil Detection Analysis ◽  
Element Analysis ◽  
Elastic Recoil Detection ◽  
Detection Analysis

Determination of the Mass Resolution and the Depth Resolution of Time of Flight Elastic Recoil Detection Analysis Using Heavy Ion Beams

1997 ◽  
Vol 36 (Part 1, No. 9A) ◽  
pp. 5737-5740 ◽  
Author(s):  
Wan Hong ◽  
Shinjiro Hayakawa ◽  
Kuniko Maeda ◽  
Shigekazu Fukuda ◽  
Minoru Yanokura ◽  
...  
Keyword(s):  
Time Of Flight ◽  
Depth Resolution ◽  
Heavy Ion ◽  
Ion Beams ◽  
Mass Resolution ◽  
Elastic Recoil ◽  
Elastic Recoil Detection Analysis ◽  
Elastic Recoil Detection ◽  
Detection Analysis

Time detector design for Time-of-Flight Elastic Recoil Detection Analysis (ToF-E ERDA)

2019 ◽  
Vol 450 ◽  
pp. 385-389
Author(s):  
Harry J. Whitlow ◽  
Patrick Jeanneret ◽  
Edouard Guibert ◽  
Liping Wang ◽  
Mathijs Van Der Meer
Keyword(s):  
Time Of Flight ◽  
Elastic Recoil ◽  
Elastic Recoil Detection Analysis ◽  
Elastic Recoil Detection ◽  
Detection Analysis ◽  
Detector Design

Iodine Induced Damage in Semiconductor Materials During Heavy Ion Recoil Elastic Recoil Detection Analysis

1996 ◽  
pp. 849-852
Author(s):  
Scott R. WALKER ◽  
Peter N. JOHNSTON ◽  
Ian F. BUBB ◽  
Warren B. STANNARD ◽  
David N. JAMIESON ◽  
...  
Keyword(s):  
Heavy Ion ◽  
Semiconductor Materials ◽  
Elastic Recoil ◽  
Elastic Recoil Detection Analysis ◽  
Elastic Recoil Detection ◽  
Detection Analysis

Heavy ion elastic recoil detection analysis set up for electronic sputtering studies

2006 ◽  
Vol 161 (4) ◽  
pp. 247-255 ◽  
Author(s):  
S. Ghosh ◽  
D. K. Avasthi ◽  
A. Tripathi ◽  
D. Kabiraj ◽  
P. Sugathan ◽  
...  
Keyword(s):  
Heavy Ion ◽  
Elastic Recoil ◽  
Elastic Recoil Detection Analysis ◽  
Elastic Recoil Detection ◽  
Detection Analysis ◽  
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