Low-energy Ion Scattering Measurement of Near-surface Damage Induced by the SiO2Dry-Etching Process
1998 ◽
Vol 37
(Part 1, No. 4A)
◽
pp. 2043-2050
◽
Keyword(s):
Surface termination and subsurface restructuring of perovskite-based solid oxide electrode materials
2014 ◽
Vol 7
(11)
◽
pp. 3593-3599
◽
Keyword(s):
2011 ◽
Vol 605
(21-22)
◽
pp. 1913-1917
◽
Keyword(s):
2013 ◽
Vol 31
(1)
◽
pp. 01A113
◽
1980 ◽
Vol 6
(3-4)
◽
pp. 204-224
◽