High-Resolution Examination of Recording Marks in Phase-Change Media Using a Scanning Near-Field Optical Microscope

2000 ◽  
Vol 39 (Part 1, No. 6A) ◽  
pp. 3599-3602 ◽  
Author(s):  
Toshiyasu Tadokoro ◽  
Toshiharu Saiki ◽  
Keiichiro Yusu ◽  
Katsutaro Ichihara
Keyword(s):  
High Resolution ◽  
Phase Change ◽  
Near Field ◽  
Optical Microscope

Nanometer-Sized Phase-Change Recording Using a Scanning Near-Field Optical Microscope with a Laser Diode

1996 ◽  
Vol 35 (Part 1, No. 1B) ◽  
pp. 443-447 ◽  
Author(s):  
Sumio Hosaka ◽  
Toshimichi Shintani ◽  
Mitsuhide Miyamoto ◽  
Akemi Hirotsune ◽  
Motoyasu Terao ◽  
...  
Keyword(s):  
Phase Change ◽  
Laser Diode ◽  
Near Field ◽  
Optical Microscope

scholarly journals Numerical modeling of the subwavelength phase-change recording using an apertureless scanning near-field optical microscope

2004 ◽  
Vol 12 (24) ◽  
pp. 5987 ◽  
Author(s):  
Thomas Grosges ◽  
Stéphane Petit ◽  
Dominique Barchiesi ◽  
Sylvain Hudlet
Keyword(s):  
Numerical Modeling ◽  
Phase Change ◽  
Near Field ◽  
Optical Microscope

Phase change recording using a scanning near‐field optical microscope

1996 ◽  
Vol 79 (10) ◽  
pp. 8082-8086 ◽  
Author(s):  
Sumio Hosaka ◽  
Toshimichi Shintani ◽  
Mitsuhide Miyamoto ◽  
Atsushi Kikukawa ◽  
Akemi Hirotsune ◽  
...  
Keyword(s):  
Phase Change ◽  
Near Field ◽  
Optical Microscope

Phase change writing in a GeSbTe film with scanning near-field optical microscope

1995 ◽  
Vol 61 (1-4) ◽  
pp. 285-289 ◽  
Author(s):  
T. Shintani ◽  
K. Nakamura ◽  
S. Hosaka ◽  
A. Hirotsune ◽  
M. Terao ◽  
...  
Keyword(s):  
Phase Change ◽  
Near Field ◽  
Optical Microscope

SNOM Probe Based on Nano-Antenna with Large Aperture and High Resolution

2011 ◽  
Vol 239-242 ◽  
pp. 2863-2866
Author(s):  
Jian Ping Shi ◽  
Ke Xiu Dong ◽  
Song Lin Wen ◽  
Ling Li Zhan ◽  
Hong Jian Liu
Keyword(s):  
High Resolution ◽  
Near Field ◽  
Optical Microscope ◽  
The Novel ◽  
Incident Wavelength ◽  
Large Aperture

We present a probe of scanning near-field optical microscope (SNOM) with large aperture and high resolution, which is added a metallic dipole nano-antenna onto the tip of the ordinary probe. Based on the FDTD algorithm we investigate numerically the measure results by different aperture probes for the same sample with the incident wavelength of 830nm and the scan height of 10nm. The results show that the resolution of the new probe is 100nm, 75nm, 50 nm, 45 nm, 50 nm, 70nm when the probe aperture is 50nm, 100nm, 130nm, 150nm, 170nm, 200nm respectively, and for the ordinary probe the resolution is 50nm，120 nm,140 nm,180 nm, 200nm, 220nm correspondingly. That is to say the resolution of the ordinary probe decrease rapidly with the increasing of the aperture, however the novel probe can maintain the high resolution.

High resolution and high sensitivity near-field optical microscope

2000 ◽  
Vol 53 (1-4) ◽  
pp. 653-656 ◽  
Author(s):  
J.M. Freyland ◽  
R. Eckert ◽  
H. Heinzelmann
Keyword(s):  
High Resolution ◽  
Near Field ◽  
High Sensitivity ◽  
Optical Microscope

Method to produce high-resolution scanning near-field optical microscope probes by beveling optical fibers

2000 ◽  
Vol 71 (8) ◽  
pp. 3118-3122 ◽  
Author(s):  
T. Held ◽  
S. Emonin ◽  
O. Marti ◽  
O. Hollricher
Keyword(s):  
High Resolution ◽  
Optical Fibers ◽  
Near Field ◽  
Optical Microscope
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