Cross-Sectional Scanning Tunneling Microscopy Study of Interfacial Roughness in an InGaAs/InP Multiple Quantum Well Structure Grown by Metalorganic Vapor Phase Epitaxy

2003 ◽  
Vol 42 (Part 1, No. 4A) ◽  
pp. 1548-1551 ◽  
Author(s):  
Ichirou Yamakawa ◽  
Takeshi Yamauchi ◽  
Ryo Oga ◽  
Yasufumi Fujiwara ◽  
Yoshikazu Takeda ◽  
...  
2007 ◽  
Vol 601 (12) ◽  
pp. L69-L72 ◽  
Author(s):  
Woei Wu Pai ◽  
T.Y. Wu ◽  
C.H. Lin ◽  
B.X. Wang ◽  
Y.S. Huang ◽  
...  

2007 ◽  
Vol 91 (16) ◽  
pp. 161907 ◽  
Author(s):  
A. Wierts ◽  
J. M. Ulloa ◽  
C. Çelebi ◽  
P. M. Koenraad ◽  
H. Boukari ◽  
...  

1998 ◽  
Vol 73 (14) ◽  
pp. 1979-1981 ◽  
Author(s):  
N. Liu ◽  
C. K. Shih ◽  
J. Geisz ◽  
A. Mascarenhas ◽  
J. M. Olson

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