Cross-Sectional Scanning Tunneling Microscopy Study of Interfacial Roughness in an InGaAs/InP Multiple Quantum Well Structure Grown by Metalorganic Vapor Phase Epitaxy
2003 ◽
Vol 42
(Part 1, No. 4A)
◽
pp. 1548-1551
◽
2005 ◽
Vol 44
(No. 43)
◽
pp. L1337-L1340
◽
2007 ◽