On achieving a complete fault coverage for sequential machines using the transition fault model

1991 ◽  
Author(s):  
Irith Pomeranz ◽  
Sudhakar M. Reddy
Keyword(s):  
Fault Coverage ◽  
Fault Model ◽  
Sequential Machines ◽  
Transition Fault

scholarly journals Fault Modeling of ECL for High Fault Coverage of Physical Defects

VLSI Design ◽  
1996 ◽  
Vol 4 (3) ◽  
pp. 231-242 ◽  
Author(s):  
Sankaran M. Menon ◽  
Yashwant K. Malaiya ◽  
Anura P. Jayasumana
Keyword(s):  
Logic Gates ◽  
Design For Testability ◽  
Fault Modeling ◽  
Fault Coverage ◽  
Fault Model ◽  
Line Detection ◽  
Lower Power ◽  
On Line ◽  
Physical Defects

Bipolar Emitter Coupled Logic (ECL) devices can now be fabricated at higher densities and consumes much lower power. Behaviour of simple and complex ECL gates are examined in the presence of physical faults. The effectiveness of the classical stuck-at model in representing physical failures in ECL gates is examined. It is shown that the conventional stuck-at fault model cannot represent a majority of circuit level faults. A new augmented stuck-at fault model is presented which provides a significantly higher coverage of physical failures. The model may be applicable to other logic families that use logic gates with both true and complementary outputs. A design for testability approach is suggested for on-line detection of certain error conditions occurring in gates with true and complementary outputs which is a normal implementation for ECL devices.

Exact Delay Fault Coverage in Sequential Logic Under Any Delay Fault Model

2006 ◽  
Vol 25 (12) ◽  
pp. 2954-2964 ◽  
Author(s):  
Mahilchi Milir Vaseekar Kumar ◽  
Spyros Tragoudas ◽  
Sreejit Chakravarty ◽  
Rathish Jayabharathi
Keyword(s):  
Fault Coverage ◽  
Fault Model ◽  
Delay Fault ◽  
Sequential Logic
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