Reducing the search space in ontology alignment using clustering techniques and topic identification

Author(s):  
Agnese Chiatti ◽  
Zlatan Dragisic ◽  
Tania Cerquitelli ◽  
Patrick Lambrix
Author(s):  
Vijay Kumar ◽  
Dinesh Kumar

The clustering techniques suffer from cluster centers initialization and local optima problems. In this chapter, the new metaheuristic algorithm, Sine Cosine Algorithm (SCA), is used as a search method to solve these problems. The SCA explores the search space of given dataset to find out the near-optimal cluster centers. The center based encoding scheme is used to evolve the cluster centers. The proposed SCA-based clustering technique is evaluated on four real-life datasets. The performance of SCA-based clustering is compared with recently developed clustering techniques. The experimental results reveal that SCA-based clustering gives better values in terms of cluster quality measures.


Author(s):  
Neelu Khare ◽  
Dharmendra S. Rajput ◽  
Preethi D

Many approaches for identifying potentially interesting items exploiting commonly used techniques of multidimensional data analysis. There is a great need for designing association-rule mining algorithms that will be scalable not only with the number of records (number of rows) in a cluster but also among domain's size (number of dimensions) in a cluster to focus on the domains. Where the items belong to domain is correlated with each other in a way that the domain is clustered into classes with a maximum intra-class similarity and a minimum inter-class similarity. This property can help to significantly used to prune the search space to perform efficient association-rule mining. For finding the hidden correlation in the obtained clusters effectively without losing the important relationship in the large database clustering techniques can be followed by association rule mining to provide better evaluated clusters.


2015 ◽  
Vol 68 (1) ◽  
pp. 99-111
Author(s):  
Tayybah Kiren ◽  
Muhammad Shoaib

Purpose – Ontologies are used to formally describe the concepts within a domain in a machine-understandable way. Matching of heterogeneous ontologies is often essential for many applications like semantic annotation, query answering or ontology integration. Some ontologies may include a large number of entities which make the ontology matching process very complex in terms of the search space and execution time requirements. The purpose of this paper is to present a technique for finding degree of similarity between ontologies that trims down the search space by eliminating the ontology concepts that have less likelihood of being matched. Design/methodology/approach – Algorithms are written for finding key concepts, concept matching and relationship matching. WordNet is used for solving synonym problems during the matching process. The technique is evaluated using the reference alignments between ontologies from ontology alignment evaluation initiative benchmark in terms of degree of similarity, Pearson’s correlation coefficient and IR measures precision, recall and F-measure. Findings – Positive correlation between the degree of similarity and degree of similarity (reference alignment) and computed values of precision, recall and F-measure showed that if only key concepts of ontologies are compared, a time and search space efficient ontology matching system can be developed. Originality/value – On the basis of the present novel approach for ontology matching, it is concluded that using key concepts for ontology matching gives comparable results in reduced time and space.


2020 ◽  
Author(s):  
Andrea Giani ◽  
de Souza Patricia Borges ◽  
Stefania Bartoletti ◽  
Flavio Morselli ◽  
Andrea Conti ◽  
...  

2019 ◽  
Vol 7 (3) ◽  
pp. 50-54
Author(s):  
N. Thilagavathi ◽  
Christy Wood ◽  
V. Hemalakshumi ◽  
V. Mathumiithaa

Author(s):  
Wing Chiu Tam ◽  
Osei Poku ◽  
R. D. (Shawn) Blanton

Abstract Systematic defects due to design-process interactions are a dominant component of integrated circuit (IC) yield loss in nano-scaled technologies. Test structures do not adequately represent the product in terms of feature diversity and feature volume, and therefore are unable to identify all the systematic defects that affect the product. This paper describes a method that uses diagnosis to identify layout features that do not yield as expected. Specifically, clustering techniques are applied to layout snippets of diagnosis-implicated regions from (ideally) a statistically-significant number of IC failures for identifying feature commonalties. Experiments involving an industrial chip demonstrate the identification of possible systematic yield loss due to lithographic hotspots.


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