Degradation Mechanism of Lightly Doped Drain (LDD) n‐Channel MOSFET's Studied by Ultraviolet Light Irradiation
1985 ◽
Vol 132
(10)
◽
pp. 2463-2466
◽
2010 ◽
Vol 28
(3)
◽
pp. 577-580
◽
Keyword(s):
2012 ◽
Vol 51
◽
pp. 05EF05
◽
1992 ◽
Vol 99
(2)
◽
pp. 221-226
◽
Keyword(s):
1998 ◽
Vol 21
(6)
◽
pp. 621-623
◽
1997 ◽
Vol 115
(1)
◽
pp. 55-60
◽
2021 ◽
Vol 214
◽
pp. 112090