ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
Hot Carrier Stress Effects of SiO2 Passivated AlGaN/GaN High Electron Mobility Transistors
ECS Transactions
◽
10.1149/1.2357210
◽
2019
◽
Vol 3
(5)
◽
pp. 213-220
◽
Cited By ~ 1
Author(s):
Min-Woo Ha
◽
Young-Hwan Choi
◽
Joon-Hyun Park
◽
Kwang-Seok Seo
◽
Min-Koo Han
Keyword(s):
Electron Mobility
◽
High Electron Mobility Transistors
◽
High Electron
◽
High Electron Mobility
◽
Hot Carrier
◽
Stress Effects
◽
Electron Mobility Transistors
◽
Hot Carrier Stress
Download Full-text
Related Documents
Cited By
References
Hot Carrier Stress Effects of SiO2 Passivated AlGaN/GaN High Electron Mobility Transistors
ECS Meeting Abstracts
◽
10.1149/ma2006-02/32/1549
◽
2006
◽
Keyword(s):
Electron Mobility
◽
High Electron Mobility Transistors
◽
High Electron
◽
High Electron Mobility
◽
Hot Carrier
◽
Stress Effects
◽
Electron Mobility Transistors
◽
Hot Carrier Stress
Download Full-text
Influence of the oxygen in Hot-Carrier-Stress-Induced degradation in AlGaN/GaN high electron mobility transistors
2018 1st Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia)
◽
10.1109/wipdaasia.2018.8734621
◽
2018
◽
Author(s):
Lixiang Chen
◽
Qing Zhu
◽
Bin Hou
◽
Jiejie Zhu
◽
Xiaohua Ma
◽
...
Keyword(s):
Electron Mobility
◽
High Electron Mobility Transistors
◽
High Electron
◽
High Electron Mobility
◽
Hot Carrier
◽
Electron Mobility Transistors
◽
Hot Carrier Stress
Download Full-text
Impact of oxygen in Electrical Properties and Hot-Carrier-Stress-Induced degradation of GaN high electron mobility transistors
Chinese Physics B
◽
10.1088/1674-1056/ac1efd
◽
2021
◽
Author(s):
Lixiang Chen
◽
Min Ma
◽
Jiecheng Cao
◽
Jiawei Sun
◽
Miaoling Que
◽
...
Keyword(s):
Electrical Properties
◽
Electron Mobility
◽
High Electron Mobility Transistors
◽
High Electron
◽
High Electron Mobility
◽
Hot Carrier
◽
Electron Mobility Transistors
◽
Hot Carrier Stress
Download Full-text
Theory of hot-carrier-induced phenomena in GaN high-electron-mobility transistors
Applied Physics Letters
◽
10.1063/1.3293008
◽
2010
◽
Vol 96
(5)
◽
pp. 053505
◽
Cited By ~ 36
Author(s):
Y. S. Puzyrev
◽
B. R. Tuttle
◽
R. D. Schrimpf
◽
D. M. Fleetwood
◽
S. T. Pantelides
Keyword(s):
Electron Mobility
◽
High Electron Mobility Transistors
◽
High Electron
◽
High Electron Mobility
◽
Hot Carrier
◽
Electron Mobility Transistors
Download Full-text
Hot carrier effects in AlGaAs/InGaAs high electron mobility transistors: Failure mechanisms induced by hot carrier testing
Journal of Applied Physics
◽
10.1063/1.366413
◽
1997
◽
Vol 82
(11)
◽
pp. 5547-5554
◽
Cited By ~ 14
Author(s):
Gaudenzio Meneghesso
◽
Alvise Mion
◽
Youcef Haddab
◽
Maura Pavesi
◽
Manfredo Manfredi
◽
...
Keyword(s):
Electron Mobility
◽
Failure Mechanisms
◽
High Electron Mobility Transistors
◽
Carrier Testing
◽
High Electron
◽
High Electron Mobility
◽
Hot Carrier
◽
Electron Mobility Transistors
◽
Hot Carrier Effects
Download Full-text
Role of bias conditions in the hot carrier degradation of AlGaN/GaN high electron mobility transistors
physica status solidi (c)
◽
10.1002/pssc.201200620
◽
2013
◽
Vol 10
(5)
◽
pp. 794-798
◽
Cited By ~ 8
Author(s):
Shubhajit Mukherjee
◽
Yevgeny Puzyrev
◽
John Hinckley
◽
Ronald D. Schrimpf
◽
Daniel M. Fleetwood
◽
...
Keyword(s):
Electron Mobility
◽
High Electron Mobility Transistors
◽
High Electron
◽
High Electron Mobility
◽
Hot Carrier
◽
Electron Mobility Transistors
◽
Hot Carrier Degradation
Download Full-text
Investigation of gate-diode degradation in normally-off p-GaN/AlGaN/GaN high-electron-mobility transistors
Applied Physics Letters
◽
10.1063/1.4935223
◽
2015
◽
Vol 107
(19)
◽
pp. 193506
◽
Cited By ~ 36
Author(s):
M. Ťapajna
◽
O. Hilt
◽
E. Bahat-Treidel
◽
J. Würfl
◽
J. Kuzmík
Keyword(s):
Electron Mobility
◽
High Electron Mobility Transistors
◽
High Electron
◽
High Electron Mobility
◽
Electron Mobility Transistors
Download Full-text
Fully Transparent AlGaN/GaN High Electron Mobility Transistors Fabricated with Indium-Tin-Oxide Electrodes
IEEE Electron Device Letters
◽
10.1109/led.2020.3048009
◽
2020
◽
pp. 1-1
Author(s):
Chih-Yao Chang
◽
Chun-Ta Hsu
◽
Yao-Luen Shen
◽
Tian-Li Wu
◽
Wei-Hung Kuo
◽
...
Keyword(s):
Tin Oxide
◽
Indium Tin Oxide
◽
Electron Mobility
◽
High Electron Mobility Transistors
◽
High Electron
◽
High Electron Mobility
◽
Electron Mobility Transistors
◽
Oxide Electrodes
Download Full-text
Low-Frequency Noise Investigation of AlGaN/GaN High-Electron-Mobility Transistors
Solid-State Electronics
◽
10.1016/j.sse.2021.108050
◽
2021
◽
pp. 108050
Author(s):
Maria Glória Caño de Andrade
◽
Luis Felipe de Oliveira Bergamim
◽
Braz Baptista Júnior
◽
Carlos Roberto Nogueira
◽
Fábio Alex da Silva
◽
...
Keyword(s):
Electron Mobility
◽
Low Frequency
◽
High Electron Mobility Transistors
◽
Frequency Noise
◽
High Electron
◽
Low Frequency Noise
◽
High Electron Mobility
◽
Electron Mobility Transistors
Download Full-text
Improved small‐signal hybrid parameter‐extraction technique for AlGaN / GaN high electron mobility transistors
International Journal of RF and Microwave Computer-Aided Engineering
◽
10.1002/mmce.22562
◽
2021
◽
Author(s):
Xuekun Du
◽
Mohamed Helaoui
◽
Jialin Cai
◽
Jun Liu
◽
Fadhel M. Ghannouchi
Keyword(s):
Electron Mobility
◽
High Electron Mobility Transistors
◽
Parameter Extraction
◽
Extraction Technique
◽
High Electron
◽
Small Signal
◽
High Electron Mobility
◽
Electron Mobility Transistors
Download Full-text
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close