Influence of Oxygen Partial Pressure on Thickness Change of Buried Oxide in Silicon-on-Insulator Structure during High-Temperature Oxidation Processes
2006 ◽
Vol 153
(12)
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pp. G1078
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2010 ◽
Vol 4
(3)
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pp. 266-270
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2014 ◽
Vol 55
(9)
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pp. 1434-1439
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Keyword(s):
2012 ◽
Vol 13
(6)
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pp. 628-638
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Keyword(s):