Application of Synchrotron Radiation Photoemission Spectroscopy to Structure Analysis of Thin Corrosion Product Films on Hot-Dip Zn-Al Coatings

Application of Synchrotron Radiation Photoemission Spectroscopy to Structure Analysis of Thin Corrosion Products Film on Hot-Dip Zn-Al Coatings

ECS Meeting Abstracts ◽

10.1149/ma2007-02/14/874 ◽

2007 ◽

Keyword(s):

Synchrotron Radiation ◽

Structure Analysis ◽

Corrosion Products ◽

Structure Analysis of Thin Corrosion Products Film on Hot-dip Zn-Al Coatings by Synchrotron Radiation Photoemission Spectroscopy

Zairyo-to-Kankyo ◽

10.3323/jcorr.56.314 ◽

2007 ◽

Vol 56 (7) ◽

pp. 314-320 ◽

Cited By ~ 5

Author(s):

Katsuhiro Nishihara ◽

Masamitsu Matsumoto ◽

Masanari Kimoto ◽

Takeo Kudo ◽

Hitoshi Uchida ◽

...

Keyword(s):

Synchrotron Radiation ◽

Structure Analysis ◽

Corrosion Products ◽

Experimental Determination of Effective Attenuation Length for SiO2 Thin Film with Synchrotron Radiation Photoemission Spectroscopy

IEEJ Transactions on Electronics Information and Systems ◽

10.1541/ieejeiss.130.1817 ◽

2010 ◽

Vol 130 (10) ◽

pp. 1817-1818

Author(s):

Keisuke Inoue ◽

Yuden Teraoka

Keyword(s):

Thin Film ◽

Synchrotron Radiation ◽

Experimental Determination ◽

Attenuation Length ◽

Sio2 Thin Film ◽

Erratum to : “In-situ” Observation Using Synchrotron Radiation Photoemission Spectroscopy on Initial Si(001) Oxidation Caused by Translational Kinetic Energy of O2

Shinku ◽

10.3131/jvsj.47.4_344b ◽

2004 ◽

Vol 47 (4) ◽

pp. 344b-344b

Keyword(s):

Synchrotron Radiation ◽

Kinetic Energy ◽

I3+–Ir4+charge disproportionation in spinelCuIr2S4investigated by synchrotron-radiation photoemission spectroscopy

Physical Review B ◽

10.1103/physrevb.76.233106 ◽

2007 ◽

Vol 76 (23) ◽

Cited By ~ 10

Author(s):

Han-Jin Noh ◽

E.-J. Cho ◽

H.-D. Kim ◽

J.-Y. Kim ◽

C.-H. Min ◽

...

Keyword(s):

Synchrotron Radiation ◽

Charge Disproportionation ◽

Characterization of air-exposure/activation cycles of porous Ti–Zr–V getter film using synchrotron radiation photoemission spectroscopy

Thin Solid Films ◽

10.1016/j.tsf.2009.01.087 ◽

2009 ◽

Vol 517 (13) ◽

pp. 3672-3676 ◽

Cited By ~ 3

Author(s):

Chien-Cheng Li ◽

Jow-Lay Huang ◽

Ran-Jin Lin ◽

Ding-Fwu Lii ◽

Chia-Hao Chen ◽

...

Keyword(s):

Synchrotron Radiation ◽

Air Exposure ◽

Porous Ti ◽

Study of the oxidation for Si nanostructures using synchrotron radiation photoemission spectroscopy

Applied Surface Science ◽

10.1016/j.apsusc.2004.05.022 ◽

2004 ◽

Vol 234 (1-4) ◽

pp. 234-239 ◽

Cited By ~ 4

Author(s):

Krishna G Nath ◽

I Shimoyama ◽

T Sekiguchi ◽

Y Baba

Keyword(s):

Synchrotron Radiation ◽

Si Nanostructures ◽

Erratum to : Real Time Analysis of Oxidation States on Si (001) Surfaces Caused by Translational Kinetic Energy of O2 by Means of Synchrotron Radiation Photoemission Spectroscopy

Shinku ◽

10.3131/jvsj.47.4_344d ◽

2004 ◽

Vol 47 (4) ◽

pp. 344d-344d

Keyword(s):

Synchrotron Radiation ◽

Kinetic Energy ◽

Real Time ◽

Oxidation States ◽

Time Analysis ◽

Real Time Analysis ◽

Oxygen-adsorption characterization of activated non-evaporable Ti–Zr–V getter films by synchrotron radiation photoemission spectroscopy

Thin Solid Films ◽

10.1016/j.tsf.2007.07.157 ◽

2007 ◽

Vol 516 (2-4) ◽

pp. 378-382 ◽

Cited By ~ 1

Author(s):

Chien-Cheng Li ◽

Jow-Lay Huang ◽

Ran-Jin Lin ◽

Ding-Fwu Lii ◽

Chia-Hao Chen

Keyword(s):

Synchrotron Radiation ◽

Oxygen Adsorption ◽

Synchrotron Radiation Photoemission Spectroscopy of Epitaxially-Grown Fluoride Films/GaAs Interfaces

10.7567/ssdm.1989.s-e-7 ◽

1989 ◽

Author(s):

Masaharu OSHIMA ◽

Yasuko YAMADA-MARUO ◽

Ruth KLAUSER

Keyword(s):

Synchrotron Radiation ◽