High Resolution SEM Investigation of Intercrystalline Corrosion on 6000-Series Aluminum Alloy with Low Copper Content

2014 ◽  
Vol 3 (9) ◽  
pp. C29-C31 ◽  
Author(s):  
K. Shimizu ◽  
K. Nisancioglu
2018 ◽  
Vol 50 (1) ◽  
pp. 326-335 ◽  
Author(s):  
Mohammad Pourgharibshahi ◽  
Hassan Saghafian ◽  
Mehdi Divandari ◽  
Giulio Timelli

2020 ◽  
Vol 834 ◽  
pp. 155138
Author(s):  
Yingxin Geng ◽  
Di Zhang ◽  
Jishan Zhang ◽  
Linzhong Zhuang

2016 ◽  
Vol 725 ◽  
pp. 653-658 ◽  
Author(s):  
Toshiro Aamaishi ◽  
Hideo Tsutamori ◽  
Eiji Iizuka ◽  
Kentaro Sato ◽  
Yuki Ogihara ◽  
...  

A new plane stress yield function using the 3rd-degree spline curve is proposed for the anisotropic behavior of sheet metals. This yield function considers the evolution of anisotropy in terms of both r values and stresses. In order to demonstrate the applicability of the proposed yield function, hole expanding tests with mild steel and 6000 series aluminum alloy sheets were simulated.


2013 ◽  
Vol 745-746 ◽  
pp. 303-308
Author(s):  
Zhen Zhang ◽  
Man Ping Liu ◽  
Ying Da Yu ◽  
Pål C. Skaret ◽  
Hans Jørgen Roven

In the present work, a peak-aged 6061 Al-Mg-Si aluminum alloy was subjected to equal channel angular pressing (ECAP) at 110 °C. The microstructure of the sample was characterized by high-resolution transmission electron microscope and weak-beam dark-field method. It was shown that the dislocation density in some local areas is much lower than the average dislocation density expected in the usual alloys processed by severe plastic deformation. High-resolution transmission electron microscope observations indicated that many full dislocations were dissociated into partial dislocations connected by stacking faults. In addition, a Z-shaped defect (i.e., a type of dislocation locks) probably formed by the reactions of the partials in different {111} planes was first observed in the ECAPed alloy. Furthermore, the precipitation behavior and sequence in the present ECAPed sample were identified by high-resolution transmission electron microscopy.


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