Characterization of Carbide Particles in S-65 Beryllium by Scanning Kelvin Probe Force Microscopy

Journal of The Electrochemical Society ◽

10.1149/2.0271707jes ◽

2017 ◽

Vol 164 (7) ◽

pp. C342-C348 ◽

Author(s):

Christopher F. Mallinson ◽

Ann Harvey ◽

John F. Watts

Keyword(s):

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Scanning Kelvin Probe ◽

Carbide Particles

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Scanning Kelvin Probe Force Microscopy and Magnetic Force Microscopy for Characterization of Duplex Stainless Steels

Journal of The Electrochemical Society ◽

10.1149/1.1572482 ◽

2003 ◽

Vol 150 (6) ◽

pp. B274 ◽

Author(s):

M. Femenia ◽

C. Canalias ◽

J. Pan ◽

C. Leygraf

Keyword(s):

Stainless Steels ◽

Magnetic Force Microscopy ◽

Magnetic Force ◽

Duplex Stainless Steels ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Corrosion behavior characterization of as extruded Mg-8Li-3Al alloy with minor alloying elements (Gd, Sn and Cu) by scanning Kelvin probe force microscopy

Corrosion Science ◽

10.1016/j.corsci.2020.108923 ◽

2020 ◽

Vol 176 ◽

pp. 108923 ◽

Author(s):

Zhi Hu ◽

Zheng Yin ◽

Zhou Yin ◽

Kun Wang ◽

Qidong Liu ◽

...

Keyword(s):

Corrosion Behavior ◽

Kelvin Probe Force Microscopy ◽

Alloying Elements ◽

Kelvin Probe ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Characterization of Phases in Duplex Stainless Steel by Magnetic Force Microscopy/Scanning Kelvin Probe Force Microscopy

Electrochemical and Solid-State Letters ◽

10.1149/1.2912601 ◽

2008 ◽

Vol 11 (7) ◽

pp. C41 ◽

Author(s):

Namurata Sathirachinda ◽

Rolf Gubner ◽

Jinshan Pan ◽

Ulf Kivisäkk

Keyword(s):

Stainless Steel ◽

Duplex Stainless Steel ◽

Magnetic Force Microscopy ◽

Magnetic Force ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Characterization of Corrosion Interfaces by the Scanning Kelvin Probe Force Microscopy Technique

Journal of The Electrochemical Society ◽

10.1149/1.1359199 ◽

2001 ◽

Vol 148 (5) ◽

pp. B163 ◽

Author(s):

V. Guillaumin ◽

P. Schmutz ◽

G. S. Frankel

Keyword(s):

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Microscopy Technique ◽

Scanning Kelvin Probe

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Characterization of post-copper CMP surface with scanning probe microscopy: Part II: Surface potential measurements with scanning Kelvin probe force microscopy

Microelectronic Engineering ◽

10.1016/j.mee.2006.10.035 ◽

2006 ◽

Vol 83 (11-12) ◽

pp. 2355-2358 ◽

Author(s):

A. Dominget ◽

J. Farkas ◽

S. Szunerits

Keyword(s):

Surface Potential ◽

Scanning Probe Microscopy ◽

Kelvin Probe Force Microscopy ◽

Scanning Probe ◽

Kelvin Probe ◽

Probe Microscopy ◽

Force Microscopy ◽

Scanning Kelvin Probe ◽

Surface Potential Measurements

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Characterization of 475°C Embrittlement of Duplex Stainless Steel Microstructure via Scanning Kelvin Probe Force Microscopy and Magnetic Force Microscopy

Journal of The Electrochemical Society ◽

10.1149/2.0311706jes ◽

2017 ◽

Vol 164 (6) ◽

pp. C207-C217 ◽

Author(s):

C. Örnek ◽

J. Walton ◽

T. Hashimoto ◽

T. L. Ladwein ◽

S. B. Lyon ◽

...

Keyword(s):

Stainless Steel ◽

Duplex Stainless Steel ◽

Magnetic Force Microscopy ◽

Magnetic Force ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Steel Microstructure ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Characterization of cast AlSi(Cu) alloys by scanning Kelvin probe force microscopy

Electrochimica Acta ◽

10.1016/j.electacta.2006.03.027 ◽

2006 ◽

Vol 51 (26) ◽

pp. 5892-5896 ◽

Author(s):

L.E. Fratila-Apachitei ◽

I. Apachitei ◽

J. Duszczyk

Keyword(s):

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Cu Alloys ◽

Scanning Kelvin Probe

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Characterization of AA2024‐T3 by Scanning Kelvin Probe Force Microscopy

Journal of The Electrochemical Society ◽

10.1149/1.1838633 ◽

1998 ◽

Vol 145 (7) ◽

pp. 2285-2295 ◽

Author(s):

P. Schmutz ◽

G. S. Frankel

Keyword(s):

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Direct observation of contact potential distributions of wafer-bonded p-GaAs/n-GaN and p-GaAs/n-Si by scanning Kelvin probe force microscopy

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/abc02a ◽

2020 ◽

Vol 59 (11) ◽

pp. 115502

Author(s):

Zhiwei Xing ◽

Wenxian Yang ◽

Yukun Zhao ◽

Junhua Long ◽

Xuefei Li ◽

...

Keyword(s):

Direct Observation ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Contact Potential ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Scanning Kelvin probe force microscopy as a means of predicting the electrochemical characteristics of the surface of a modified AA4xxx/AA3xxx (Al alloys) brazing sheet

Electrochimica Acta ◽

10.1016/j.electacta.2012.10.051 ◽

2013 ◽

Vol 88 ◽

pp. 330-339 ◽

Author(s):

F. Norouzi Afshar ◽

J.H.W. de Wit ◽

H. Terryn ◽

J.M.C. Mol

Keyword(s):

Al Alloys ◽

Kelvin Probe Force Microscopy ◽

Electrochemical Characteristics ◽

Kelvin Probe ◽

Force Microscopy ◽

Scanning Kelvin Probe

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