Scanning Kelvin Probe Force Microscopy and Magnetic Force Microscopy for Characterization of Duplex Stainless Steels

2003 ◽  
Vol 150 (6) ◽  
pp. B274 ◽  
Author(s):  
M. Femenia ◽  
C. Canalias ◽  
J. Pan ◽  
C. Leygraf
Keyword(s):  
Stainless Steels ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Duplex Stainless Steels ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Scanning Kelvin Probe

Detection of secondary phases in duplex stainless steel by magnetic force microscopy and scanning Kelvin probe force microscopy

2013 ◽  
Vol 86 ◽  
pp. 250-262 ◽  
Author(s):  
J. Ramírez-Salgado ◽  
M.A. Domínguez-Aguilar ◽  
B. Castro-Domínguez ◽  
P. Hernández-Hernández ◽  
R.C. Newman
Keyword(s):  
Stainless Steel ◽  
Duplex Stainless Steel ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Kelvin Probe Force Microscopy ◽  
Secondary Phases ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Scanning Kelvin Probe

scholarly journals Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy–magnetic force microscopy combination

2011 ◽  
Vol 2 ◽  
pp. 552-560 ◽  
Author(s):  
Miriam Jaafar ◽  
Oscar Iglesias-Freire ◽  
Luis Serrano-Ramón ◽  
Manuel Ricardo Ibarra ◽  
Jose Maria de Teresa ◽  
...  
Keyword(s):  
Long Range ◽  
Electrostatic Interaction ◽  
Electrostatic Interactions ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Superparamagnetic Nanoparticles ◽  
Kelvin Probe Force Microscopy ◽  
Magnetic Interactions ◽  
Kelvin Probe ◽  
Force Microscopy

The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions. In particular, magnetic force microscopy (MFM) is used to characterize the domain configuration in ferromagnetic materials such as thin films grown by physical techniques or ferromagnetic nanostructures. It is a usual procedure to separate the topography and the magnetic signal by scanning at a lift distance of 25–50 nm such that the long range tip–sample interactions dominate. Nowadays, MFM is becoming a valuable technique to detect weak magnetic fields arising from low dimensional complex systems such as organic nanomagnets, superparamagnetic nanoparticles, carbon-based materials, etc. In all these cases, the magnetic nanocomponents and the substrate supporting them present quite different electronic behavior, i.e., they exhibit large surface potential differences causing heterogeneous electrostatic interaction between the tip and the sample that could be interpreted as a magnetic interaction. To distinguish clearly the origin of the tip–sample forces we propose to use a combination of Kelvin probe force microscopy (KPFM) and MFM. The KPFM technique allows us to compensate in real time the electrostatic forces between the tip and the sample by minimizing the electrostatic contribution to the frequency shift signal. This is a great challenge in samples with low magnetic moment. In this work we studied an array of Co nanostructures that exhibit high electrostatic interaction with the MFM tip. Thanks to the use of the KPFM/MFM system we were able to separate the electric and magnetic interactions between the tip and the sample.

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