Comparative Study of AlGaN/AlN/GaN Metal-Oxide-Semiconductor High Electron Mobility Transistors with Ni/Au Gate Electrode

Author(s):  
Jing-Shiuan Niu ◽  
Li-An Tsai ◽  
Wei-Che Shao ◽  
Jung-Hui Tsai ◽  
Wen-Chau Liu
Sign in / Sign up

Export Citation Format

Share Document