Low Energy X-Ray and Electron Absorption Within Solids (100-1500 ev Region)

1973 ◽  
Vol 17 ◽  
pp. 150-213 ◽  
Author(s):  
Burton L. Henke ◽  
Eric S. Ebisu
Keyword(s):  
Cross Sections ◽  
Energy Region ◽  
Auger Electron ◽  
Light Element ◽  
Low Energy ◽  
Interaction Cross Section ◽  
Interaction Coefficients ◽  
Element Analysis ◽  
X Ray ◽  
Precise Knowledge

AbstractQuantitative analysis by x-ray fluorescence and photoelectron and Auger electron analysis can be effectively extended through a precise knowledge of the total aad subshell photoionization cross sections. Light element and intermediate element analysis, as based upon K and L series fluorescence respectively, involve x-ray interactions in the low energy region, Optimized analysis for essentially all the elements by x-ray induced photoelectron and Auger electron spectroscopy involves both x-ray and electron interactions in the low energy region. Unfortunately, theory and measurement for interaction cross sections in this 100-1500 eV region are difficult, particularly for the heavier elements. Nevertheless, recent advances in experimental and computerized-theoretical techniques for the determination of low energy interaction coefficients do permit establishing appreciatly more complete tabulations of cross sections than are currently available in this energy region.In this paper, the types of interaction cross section data that are needed for quantitative x-ray and electron analysis are defined. Such data that are available from experiment and from theory are reviewed and compared. Some newer techniques for the measurement of cross sections are discussed. And finally, new “state of the art” tables are presented for the mass absorption coefficients of all of the elements and of some special laboratory materials. These are tabulated specifically for twenty-six of the most commonly applied characteristic wavelengths in the 8-110 A region and are based upon the best currently available theoretical and experimental data.

Developments in Scanning Auger Microscopy

1978 ◽  
Vol 36 (3) ◽  
pp. 280-291
Author(s):  
J.A. Venables ◽  
A.P. Janssen
Keyword(s):  
Auger Electron ◽  
Light Element ◽  
Mean Free Path ◽  
Element Analysis ◽  
Auger Electrons ◽  
X Ray ◽  
Atomic Relaxation ◽  
Auger Microscopy ◽  
Energy Processes ◽  
Inelastic Mean Free Path

In the last decade, Auger Electron Spectroscopy (AES) has become a standard tool of surface physics and chemistry. Under electron bombardment, atoms emit Auger electrons having characteristic energies, so that the atomic species present can be identified after the manner of X-ray spectroscopy. AES is complementary to X-ray spectroscopy in several ways. First, it is much more surface sensitive, since the inelastic mean free path for Auger electrons, whose energies are typically in the range 50 - 1500 eV, is ~ lnm. Second, atomic relaxation following the primary ionization results in either an X-ray or an Auger electron. Auger emission is dominant for low energy processes, so that AES is relatively more favourable for light element analysis than X-ray spectroscopy.

An Introduction to Low Energy X-Ray and Electron Analysis

1969 ◽  
Vol 13 ◽  
pp. 1-25 ◽  
Author(s):  
Burton L. Henke
Keyword(s):  
Electron Spectroscopy ◽  
Auger Electron ◽  
Light Element ◽  
Low Energy ◽  
X Rays ◽  
Excitation Spectra ◽  
X Ray ◽  
Langmuir Blodgett ◽  
Electrostatic Analyzer ◽  
Introductory Review

This is an introductory review of the physics and applications of low energy x-rays and electrons in the 10-1000 ev region. The basic interactions of these radiations within matter are discussed and typical de-excitation spectra, fluorescent x-ray and photoAuger electron, are presented. Specific examples of spectrographic methods and instruments for the low energy region are described as “based upon the use of long-spaced, Langmuir-Blodgett type of multilayers for ultrasoft x-ray analysis and the use of the hemispherical electrostatic analyzer for photo-Auger electron spectroscopy. Some examples of spectrographic signal, signal/background, and resolution are presented for applications to light element fluorescence, valence emission band, and photo-Auger electron analysis. The special aspects of the low energy x-ray analysis of high temperature plasmas and of x-ray astronomical sources in general are described.

scholarly journals Application of a Low Energy X-Ray Spectrometer to Analyses of Suspended Air Particulate Matter

1975 ◽  
Vol 19 ◽  
pp. 305-321 ◽  
Author(s):  
R. D. Giauque ◽  
R. B. Garrett ◽  
L. Y. Goda ◽  
J. M. Jaklevic ◽  
D. F. Malone
Keyword(s):  
Size Effects ◽  
Semiconductor Detector ◽  
Light Element ◽  
Low Energy ◽  
Calibration Technique ◽  
Element Analysis ◽  
Air Particulate Matter ◽  
Excitation Radiation ◽  
X Ray ◽  
Air Particulate

A semiconductor detector x-ray spectrometer has been constructed for the analysis of elements in air particulate specimens. The excitation radiation is provided, either directly or indirectly, using a low power (40 watts) Ag anode x-ray tube. Less than 100 ng for most of the elements in the range Mg → Zr, Pb are easily detected within two 1-minute counting intervals. A calibration technique for light element analysis and an experimental method which compensates for particle size effects will be discussed.

X-Ray Fluorescence Analysis for Sodium, Fluorine, Oxygen, Nitrogen, Carbon, and Boron*

1963 ◽  
Vol 7 ◽  
pp. 460-488 ◽  
Author(s):  
Burton L. Henke
Keyword(s):  
Electron Microprobe ◽  
Light Element ◽  
Fluorescence Analysis ◽  
Soap Film ◽  
Low Energy ◽  
Light Elements ◽  
Element Analysis ◽  
Close Coupling ◽  
X Ray ◽  
Long Wavelength

AbstractOptimized vacuum spectrographic measurement of low-energy fluorescence has been found to yield counting rates and peak-to-background ratios which are enough to permit the extension of fluorescence analysis for elementary chemistry into the light-element range—sodium through boron. This is accomplished with an efficient, demountable ultrasoft X-ray source, with close coupling among source, crystal, and detector, with KAP and multilayered stearate analyzers, and with, optimized flow-propordonal counting. Specific methods for achieving peak-to-background ratios on practical samples containing these light elements are presented. The extension of these methods of light-element analysis with the use of curved long-spaced crystals for X-Ray macroprobe and electron microprobe measurements is discussed. The design and construction of multilayered soap film “crystals” for long-wavelength X-ray analysis is described.

Computer programs for the calculation of x-ray intensities emitted by elements in multi-layer structures

1990 ◽  
Vol 48 (2) ◽  
pp. 216-217
Author(s):  
G.F. Bastin ◽  
H.J.M. Heijligers ◽  
J.M. Dijkstra
Keyword(s):  
Software Package ◽  
Light Element ◽  
Matrix Correction ◽  
Excellent Performance ◽  
Element Analysis ◽  
X Ray ◽  
Know How ◽  
Accurate Knowledge ◽  
Layer Structures ◽  
Bulk Matrix

For the calculation of X-ray intensities emitted by elements present in multi-layer systems it is vital to have an accurate knowledge of the x-ray ionization vs. mass-depth (ϕ(ρz)) curves as a function of accelerating voltage and atomic number of films and substrate. Once this knowledge is available the way is open to the analysis of thin films in which both the thicknesses as well as the compositions can usually be determined simultaneously.Our bulk matrix correction “PROZA” with its proven excellent performance for a wide variety of applications (e.g., ultra-light element analysis, extremes in accelerating voltage) has been used as the basis for the development of the software package discussed here. The PROZA program is based on our own modifications of the surface-centred Gaussian ϕ(ρz) model, originally introduced by Packwood and Brown. For its extension towards thin film applications it is required to know how the 4 Gaussian parameters α, β, γ and ϕ(o) for each element in each of the films are affected by the film thickness and the presence of other layers and the substrate.

Low‐energy photoionization cross sections from proton‐induced x‐ray spectroscopy

1975 ◽  
Vol 27 (12) ◽  
pp. 704-706 ◽  
Author(s):  
A. Lurio ◽  
W. Reuter
Keyword(s):  
Cross Sections ◽  
Low Energy ◽  
X Ray

Low-energy x-ray interaction coefficients: Photoabsorption, scattering, and reflection

1982 ◽  
Vol 27 (1) ◽  
pp. 1-144 ◽  
Author(s):  
B.L. Henke ◽  
P. Lee ◽  
T.J. Tanaka ◽  
R.L. Shimabukuro ◽  
B.K. Fujikawa
Keyword(s):  
Low Energy ◽  
Interaction Coefficients ◽  
X Ray

Measurement of Cu K and Ag, In and Sn L X-ray production cross sections by low-energy positron impact

2007 ◽  
Vol 76 (3) ◽  
pp. 465-468 ◽  
Author(s):  
Yasuyuki Nagashima ◽  
Wataru Shigeta ◽  
Toshio Hyodo ◽  
Masaya Iwaki
Keyword(s):  
Cross Sections ◽  
Production Cross ◽  
Low Energy ◽  
Positron Impact ◽  
X Ray

Vacuum X-Ray Instrumentation and its Application to Mill-Products Control

1961 ◽  
Vol 5 ◽  
pp. 477-485
Author(s):  
H. T. Dryer ◽  
E. Davidson ◽  
G. Andermann
Keyword(s):  
Sample Preparation ◽  
Light Element ◽  
Analytical Sensitivity ◽  
Element Analysis ◽  
X Ray ◽  
Design Concepts ◽  
Precision And Accuracy ◽  
The Way

AbstractWith the introduction in 1960 of the first commercial multichannel vacuum X-ray spectrometers, ARL opened the way for greater economy of operation for light-element analysis over conventional helium-path instrumentation. The design concepts and features of these instruments are discussed, including the adaptability to “on-stream” or continuous analyzer programs. The successful application of vacuum X-ray equipment for the analysis of ores, concentrates, and slags will be presented. Factors relating to sample preparation, precision, and accuracy are given and analytical sensitivity and speed are covered.

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