Analytical and Experimental Investigation of Flow and Fracture Mechanisms Induced by Indentation in Single Crystal MgO

1982 ◽  
Vol 26 ◽  
pp. 299-306
Author(s):  
T. Larchuk ◽  
T. Kato ◽  
R. N. Pangborn ◽  
J. C. Conway
Keyword(s):  
Fracture Behavior ◽  
Large Degree ◽  
Surface Damage ◽  
Fracture Mechanisms ◽  
Flow Zone ◽  
Double Crystal ◽  
Contact Loading ◽  
X Ray ◽  
Static Contact ◽  
And Performance

The flow and fracture behavior of ceramic and other brittle materials under the influence of contact loading is important to both component fabrication and performance. The ease of machining, severity of residual surface damage and rate of wear during subsequent service are controlled to a large degree by the character and extent of the flow zone and its influence on the fracture mode. This Investigation was undertaken to provide experimental verification of the results obtained through elastic/plastic finite element modeling cf the stress distribution and deformations introduced by static contact loading. Experimentally, X-ray double-crystal diffractometry (DCD) was applied to obtain a mapping of the distortions produced beneath a Vickers indenter, and hence to evaluate the effect of material and geometric parameters on the flow and fracture mechanisms.

Depth of Saw and Lap Damage in Germanium

1963 ◽  
Vol 7 ◽  
pp. 159-173 ◽  
Author(s):  
John F. Knudsen
Keyword(s):  
Scintillation Counter ◽  
Surface Damage ◽  
Etching Time ◽  
Unexpected Finding ◽  
X Ray Diffraction ◽  
Double Crystal ◽  
X Ray ◽  
Damaged Material ◽  
Limiting Value ◽  
Double Crystal Diffractometer

AbstractA study utilizing an application of X-ray diffraction analysis has been made to determine the depth of surface damage in s ingle-crystal wafers of germanium. Damage was introduced by mechanical lapping and sawing. A scintillation-counter double-crystal diffractometer system was used with a 3-m evacuated collitnator. This experimental arrangement employed the (220) reflection, from a silicon monochromator, using Cu Kα1 radiation. All wafers were taken from dislocation-free crystals which were subsequently centerless ground, sawed, lapped, and etched. Half-widths were determined for the sawed and lapped conditions. Successive etchings were used to remove the damaged surface layer with the resulting halfwidths being plotted as a function of thickness removed and etching time.The depths of damage—8.0 ± 0.7 μ for sawing and 3.0 ± 0.7 μ for lapping—were indicated by the depth at which the line breadth measurements reached a limiting value. For crystals used in this study, the median value for this limiting half-width was 28″. The experimental data expressing the rate of etching indicates the presence of two separate rates—one for the damaged material and one for the undamaged substrate. An unexpected finding is a faster etch rate for the undamaged material than that observed for the damaged layer. Quite good correlation is obtained between the depth of damage as determined by X-ray and etching techniques.

A DOUBLE CRYSTAL MONOCHROMATOR FOR SOFT X-RAY BEAM LINE OF UVSOR

1986 ◽  
Vol 47 (C8) ◽  
pp. C8-135-C8-137
Author(s):  
T. MURATA ◽  
T. MATSUKAWA ◽  
M. MORI ◽  
M. OBASHI ◽  
S.-I. NAO-E ◽  
...  
Keyword(s):  
Beam Line ◽  
Double Crystal ◽  
X Ray ◽  
Double Crystal Monochromator

scholarly journals Morphology and Mechanical Properties of Fossil Diatom Frustules from Genera of Ellerbeckia and Melosira

Nanomaterials ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 1615
Author(s):  
Qiong Li ◽  
Jürgen Gluch ◽  
Zhongquan Liao ◽  
Juliane Posseckardt ◽  
André Clausner ◽  
...  
Keyword(s):  
Fracture Behavior ◽  
Three Dimensional ◽  
Mechanical Tests ◽  
Fracture Force ◽  
Thickness Change ◽  
X Ray ◽  
Transmission Electron ◽  
Percentage Concentration ◽  
Morphology Characterization

Fossil frustules of Ellerbeckia and Melosira were studied using laboratory-based nano X-ray tomography (nano-XCT), transmission electron microscopy (TEM) and energy-dispersive X-ray spectroscopy (EDS). Three-dimensional (3D) morphology characterization using nondestructive nano-XCT reveals the continuous connection of fultoportulae, tube processes and protrusions. The study confirms that Ellerbeckia is different from Melosira. Both genera reveal heavily silicified frustules with valve faces linking together and forming cylindrical chains. For this cylindrical architecture of both genera, valve face thickness, mantle wall thickness and copulae thickness change with the cylindrical diameter. Furthermore, EDS reveals that these fossil frustules contain Si and O only, with no other elements in the percentage concentration range. Nanopores with a diameter of approximately 15 nm were detected inside the biosilica of both genera using TEM. In situ micromechanical experiments with uniaxial loading were carried out within the nano-XCT on these fossil frustules to determine the maximal loading force under compression and to describe the fracture behavior. The fracture force of both genera is correlated to the dimension of the fossil frustules. The results from in situ mechanical tests show that the crack initiation starts either at very thin features or at linking structures of the frustules.

scholarly journals A Magnetic Nanocomposite Modifier for Improved Ultrasensitive Detection of Hexavalent Chromium in Water Samples

Chemosensors ◽  
2021 ◽  
Vol 9 (8) ◽  
pp. 189
Author(s):  
Nuša Hojnik ◽  
Olivija Plohl ◽  
Matjaž Finšgar
Keyword(s):  
Electron Microscopy ◽  
Analytical Performance ◽  
Magnetic Nanocomposite ◽  
Ex Situ ◽  
Trace Determination ◽  
Silica Layer ◽  
X Ray ◽  
Square Wave ◽  
Static Contact

In this work, different electrodes were employed for the determination of Cr(VI) by the cathodic square‑wave voltammetry (SWV) technique and the square-wave adsorptive stripping voltammetry (SWAdSV) technique in combination with diethylenetriaminepentaacetic acid. Using SWV, a comparison of the analytical performance of the bare glassy carbon electrode (GCE), ex situ electrodes (antimony-film—SbFE, copper-film—CuFE, and bismuth-film—BiFE), and the GCE modified with a new magnetic nanocomposite (MNC) material was performed. First, the MNC material was synthesized, i.e., MNPs@SiO2@Lys, where MNPs stands for magnetic maghemite nanoparticles, coated with a thin amorphous silica (SiO2) layer, which was additionally functionalized with derived lysine (Lys). The crystal structure of the prepared MNCs was confirmed by X-ray powder diffraction (XRD), while the morphology and nano-size of the MNCs were investigated by field emission scanning electron microscopy (FE-SEM) and transmission electron microscopy (TEM), where TEM was additionally used to observe the MNP core and silica layer thickness. The presence of functional groups of the MNCs was investigated by attenuated total reflection Fourier transform infrared spectroscopy (ATR-FTIR) and surface analysis was performed by X-ray photoelectron spectroscopy (XPS). The hydrophilicity of the modified electrodes was also tested by static contact angle measurements. Then, MNPs@SiO2@Lys was applied onto the electrodes and used with the SWV and SWAdSV techniques. All electrodes tested with the SWV technique were effective for Cr(VI) trace determination. On the other hand, the SWAdSV technique was required for ultra-trace determination of Cr(VI). Using the SWAdSV technique, it was shown that a combination of ex situ BiFE with the deposited MNPs@SiO2@Lys resulted in excellent analytical performance (LOQ = 0.1 µg/L, a linear concentration range of 0.2–2.0 µg/L, significantly higher sensitivity compared to the SWV technique, an RSD representing reproducibility of 9.0%, and an average recovery of 98.5%). The applicability of the latter system was also demonstrated for the analysis of a real sample.

Double Crystal X‐Ray Dilatometer Using Continuous Radiation

1971 ◽  
Vol 42 (2) ◽  
pp. 196-199 ◽  
Author(s):  
Virgil E. Bottom ◽  
Renê Ayres Carvalho
Keyword(s):  
Double Crystal ◽  
X Ray ◽  
Continuous Radiation

Strain Shift Coefficients for Phonons in Si-Ge Heterostructures

1991 ◽  
Vol 239 ◽  
Author(s):  
J.-M. Baribeau ◽  
D. J. Lockwood
Keyword(s):  
Molecular Beam ◽  
Composition Dependence ◽  
Vibration Mode ◽  
Phonon Frequency ◽  
Longitudinal Optical ◽  
Stress Factor ◽  
Double Crystal ◽  
Raman Scattering Spectroscopy ◽  
X Ray ◽  
Shift Coefficient

ABSTRACTStrain shift coefficient measurements for longitudinal optical phonons in molecular beam epitaxy grown metastable pseudomorphic Si1−xGex layers on (100) Si (0 < x < 0.35) and Ge (0.80 < x < 1) are reported. Strain in partially relaxed annealed specimens was obtained by double-crystal x-ray diffractometry and the corresponding strain phonon shift was measured by Raman scattering spectroscopy. For epilayers grown on Si it was found that the epilayer Si-Si phonon frequency varies linearly with strain. The magnitude of the strain shift coefficient b however showed a small composition dependence varying from b ≈ -700 cm-1 at x = 0 to b ≈ -950 cm-1 at x = 0.35, corresponding to a stress factor τ = 0.40 + 0.57x: + 0.13x2 cm-1/kbar. For the Ge-Ge vibration mode in epilayers grown on Ge, b decreased from ∼-425 cm-1 at x = 1 to ∼-500 cm-1 at x = 0.8, corresponding to a stress factor τ ≈ 0.52 – 0.14x - 0.08x2 cm-1/kbar.

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