A Comparison of the XRF11 and EXACT Fundamental Parameters Programs when Using Filtered Direct and Secondary Target Excitation in EDXRF

1982 ◽  
Vol 26 ◽  
pp. 369-376 ◽  
Author(s):  
Ronald A. Vane

The XRF11 program by John Criss and the EXACT program are two commercially available fundamental parameters programs for energy dispersive x-ray fluorescence spectrometry (EDXRF). These programs are both based on the same underlying equations but use different approaches to the calculations. The EXACT program assumes monochromatic excitation, and the XEF11 program models polychromatic excitation sources. There are also great differences in how the two programs approach the iterations in the calculations and in how the data from standards are used in the two programs for calibration.To produce the monochromatic excitation neeiled by the EXACT program, secondary targets have been the preferred method. But it is also possible to approximate monochromatic excitation by using filtered direct excitation. The purpose of this study is to compare the data obtained from both secondary targets and direct filtered excitation as processed through both XRF11 and EXACT.

1980 ◽  
Vol 24 ◽  
pp. 383-392
Author(s):  
Wolfhard Wegscheider ◽  
Kurt Müller ◽  
Hugo M. Ortner

AbstractThe potential of energy-dispersive X-ray fluorescence spectrometry for analysis of refractory metals and WC-based hard metals is investigated. Both, photon excitation by filtered tube radiation and by the characteristic, lines of a secondary target are employed. Both excitation systems give good results. If the counting times are adjusted to account for the lower sensitivity of energy dispersive as opposed to wavelength dispersive X-ray spectrometry the detection limit and precision data are comparable. The multielement analyses of interest in these applications that comprise an energy range of 5 keV or more are better handled by direct excitation with filtered tube radiations than either by secondary target excitation or by wavelength dispersive X-ray spectrometry.


1985 ◽  
Vol 57 (8) ◽  
pp. 1691-1694 ◽  
Author(s):  
Claude. Ruch ◽  
Faramarz. Rastegar ◽  
Robert. Heimburger ◽  
Eddie A. Maier ◽  
Maurice J. F. Leroy

2014 ◽  
Vol 43 (2) ◽  
pp. 47-53 ◽  
Author(s):  
Toshio MIYAZAKI ◽  
Shin-ichi YAMASAKI ◽  
Noriyoshi TSUCHIYA ◽  
Satoshi OKUMURA ◽  
Ryoichi YAMADA ◽  
...  

2021 ◽  
Vol 0 (0) ◽  
Author(s):  
Tong Chen ◽  
Xingpu Qi ◽  
Zaiyong Si ◽  
Qianwei Cheng ◽  
Hui Chen

Abstract In this work, a method was established for discriminating geographical origins of wheat flour based on energy dispersive X-ray fluorescence spectrometry (ED-XRF) and chemometrics. 68 wheat flour samples from three different origins were collected and analyzed using ED-XRF technology. Firstly, the principal component analysis method was applied to analyze the feasibility of discrimination and reduce data dimensionality. Then, Competitive Adaptive Reweighted Sampling (CARS) was used to further extract feature variables, and 12 energy variables (corresponding to mineral elements) were identified and selected to characterize the geographical attributes of wheat flour samples. Finally, a non-linear model was constructed using principal component analysis and quadratic discriminant analysis (QDA). The CARS-PCA-QDA model showed that the accuracy of five-fold cross-validation was 84.25%. The results showed that the established method was able to select important energy channel variables effectively and wheat flour could be classified based on geographical origins with chemometrics, which could provide a theoretical basis for unveiling the relationship between mineral element composition and wheat origin.


1982 ◽  
Vol 54 (11) ◽  
pp. 1782-1786 ◽  
Author(s):  
Kirk K. Nielson ◽  
Ronald W. Sanders ◽  
John C. Evans

1977 ◽  
Vol 49 (12) ◽  
pp. 1734-1737 ◽  
Author(s):  
John A. Boslett ◽  
Robert L. R. Towns ◽  
Robert G. Megargle ◽  
Karl H. Pearson ◽  
Thomas C. Furnas

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