scholarly journals Demystifying MR Neurography of the Lumbosacral Plexus: From Protocols to Pathologies

2018 ◽  
Vol 2018 ◽  
pp. 1-20 ◽  
Author(s):  
Francisco J. Muniz Neto ◽  
Eduardo N. Kihara Filho ◽  
Frederico C. Miranda ◽  
Laercio A. Rosemberg ◽  
Durval C. B. Santos ◽  
...  

Magnetic resonance neurography is a high-resolution imaging technique that allows evaluating different neurological pathologies in correlation to clinical and the electrophysiological data. The aim of this article is to present a review on the anatomy of the lumbosacral plexus nerves, along with imaging protocols, interpretation pitfalls, and most common pathologies that should be recognized by the radiologist: traumatic, iatrogenic, entrapment, tumoral, infectious, and inflammatory conditions. An extensive series of clinical and imaging cases is presented to illustrate key-points throughout the article.

1992 ◽  
Vol 263 ◽  
Author(s):  
W.J. Chen ◽  
F.R. Chen ◽  
L.J. Chen

ABSTRACTHigh resolution transmission electron microscopy (HRTEM) has been applied to study the atomic structure of NiSi2 /(001)Si interface. Previous HRTEM result suggested that Ni atoms in the boundary core are six-fold coordinated and Si atoms are everywhere tetrahedrally coordinated. In this work, high resolution imaging technique and computer image simulation were used to study the atomic structure of NiSi2 /(001)Si interfaces and a new interface structure was found. For the new interface structure, Ni and Si atoms are also six-fold and tetrahedrally coordinated, respectively, with an extra layer of fourfold planar bonded Si atoms present at the interface.


2011 ◽  
Vol 41 (1) ◽  
pp. 15-31 ◽  
Author(s):  
Ty K. Subhawong ◽  
Kenneth C. Wang ◽  
Shrey K. Thawait ◽  
Eric H. Williams ◽  
Shahreyar Shar Hashemi ◽  
...  

Author(s):  
J.M. Cowley

By extrapolation of past experience, it would seem that the future of ultra-high resolution electron microscopy rests with the advances of electron optical engineering that are improving the instrumental stability of high voltage microscopes to achieve the theoretical resolutions of 1Å or better at 1MeV or higher energies. While these high voltage instruments will undoubtedly produce valuable results on chosen specimens, their general applicability has been questioned on the basis of the excessive radiation damage effects which may significantly modify the detailed structures of crystal defects within even the most radiation resistant materials in a period of a few seconds. Other considerations such as those of cost and convenience of use add to the inducement to consider seriously the possibilities for alternative approaches to the achievement of comparable resolutions.


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