Comparative Effect of 200 KV. X-Rays and Gamma Rays on the Pupae of Drosophila Melanogaster: I. Determination of "Equivalent Roentgen" Value for Gamma Rays: II. Summation Experiments with X-Rays and Gamma Rays

In the current work, it was investigated to the K X-ray fluorescence efficiency and chemical effect on vacancy transfer probability for some tin compounds. We used Br2Tin, TinI2, SeTin, TinF2, TinSO4, TinCl2, TinO and TinS compounds for experimental study. The target samples were irradiated with 241Am annular radioactive source at the intensity of 5 Ci which emits gamma rays at wavelength of 0.2028 nm. The characteristic x-rays emitted because of the excitation are collected by a high-resolution HPGe semiconductor detector. It has been determined that the experimental calculations of the tin (Sn) element are compatible with the theoretical calculation. In addition, we have calculated the experimental intensity ratios, fluorescence yields and total vacancy transfer probabilitiesfor other Sn compounds.

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Non-Destructive Determination of Chemical Effects onFluorescence Yields and Vacancy Transfer Probabilities ofTin Compounds

Characterization and Application of Nanomaterials ◽

10.24294/can.v0i0.562 ◽

2018 ◽

Author(s):

Ahmet Tursucu ◽

Mehmet Haskul ◽

Asaf Tolga Ulgen

Keyword(s):

Gamma Rays ◽

Chemical Effect ◽

X Rays ◽

Tin Compounds ◽

X Ray ◽

Chemical Effects ◽

Fluorescence Efficiency ◽

Non Destructive ◽

Transfer Probability

In the current work, it was investigated to the K X-ray fluorescence efficiency and chemical effect on vacancy transfer probability for some tin compounds. We used Br2Tin, TinI2, SeTin, TinF2, TinSO4, TinCl2, TinO and TinS compounds for experimental study. The target samples were irradiated with 241Am annular radioactive source at the intensity of 5 Ci which emits gamma rays at wavelength of 0.2028 nm. The characteristic x-rays emitted because of the excitation are collected by a high-resolution HPGe semiconductor detector. It has been determined that the experimental calculations of the tin (Sn) element are compatible with the theoretical calculation. In addition, we have calculated the experimental intensity ratios, fluorescence yields and total vacancy transfer probabilitiesfor other Sn compounds.

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Determination of coefficient of mass transfer in porous bodies by absorption of X-rays and gamma rays

The International Journal of Applied Radiation and Isotopes ◽

10.1016/0020-708x(75)90117-9 ◽

1975 ◽

Vol 26 (4) ◽

pp. 201-205

Author(s):

Lino Daddi ◽

E. Latrofa ◽

G. Chiappa

Keyword(s):

Mass Transfer ◽

Gamma Rays ◽

X Rays ◽

Porous Bodies

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Non-Destructive Determination of Chemical Effects onFluorescence Yields and Vacancy Transfer Probabilities ofTin Compounds

Characterization and Application of Nanomaterials ◽

10.24294/can.v1i3.562 ◽

2018 ◽

Vol 1 (3) ◽

Cited By ~ 1

Author(s):

Ahmet Tursucu ◽

Mehmet Haskul ◽

Asaf Tolga Ulgen

Keyword(s):

Gamma Rays ◽

Chemical Effect ◽

X Rays ◽

Tin Compounds ◽

X Ray ◽

Chemical Effects ◽

Fluorescence Efficiency ◽

Non Destructive ◽

Transfer Probability

In the current work, it was investigated to the K X-ray fluorescence efficiency and chemical effect on vacancy transfer probability for some tin compounds. We used Br2Tin, TinI2, SeTin, TinF2, TinSO4, TinCl2, TinO and TinS compounds for experimental study. The target samples were irradiated with 241Am annular radioactive source at the intensity of 5 Ci which emits gamma rays at wavelength of 0.2028 nm. The characteristic x-rays emitted because of the excitation are collected by a high-resolution HPGe semiconductor detector. It has been determined that the experimental calculations of the tin (Sn) element are compatible with the theoretical calculation. In addition, we have calculated the experimental intensity ratios, fluorescence yields and total vacancy transfer probabilitiesfor other Sn compounds.

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Problems in Thin-Film X-ray Quantification

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100135897 ◽

1990 ◽

Vol 48 (2) ◽

pp. 458-459

Author(s):

J N Chapman ◽

W A P Nicholson

Keyword(s):

Thin Film ◽

Specimen Thickness ◽

X Rays ◽

Characteristic Peak ◽

Local Composition ◽

X Ray ◽

Measured Ratio ◽

Path Lengths ◽

Composition Changes

Energy dispersive x-ray microanalysis (EDX) is widely used for the quantitative determination of local composition in thin film specimens. Extraction of quantitative data is usually accomplished by relating the ratio of the number of atoms of two species A and B in the volume excited by the electron beam (nA/nB) to the corresponding ratio of detected characteristic photons (NA/NB) through the use of a k-factor. This leads to an expression of the form nA/nB = kAB NA/NB where kAB is a measure of the relative efficiency with which x-rays are generated and detected from the two species.Errors in thin film x-ray quantification can arise from uncertainties in both NA/NB and kAB. In addition to the inevitable statistical errors, particularly severe problems arise in accurately determining the former if (i) mass loss occurs during spectrum acquisition so that the composition changes as irradiation proceeds, (ii) the characteristic peak from one of the minority components of interest is overlapped by the much larger peak from a majority component, (iii) the measured ratio varies significantly with specimen thickness as a result of electron channeling, or (iv) varying absorption corrections are required due to photons generated at different points having to traverse different path lengths through specimens of irregular and unknown topography on their way to the detector.

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