scholarly journals Non-Destructive Determination of Chemical Effects onFluorescence Yields and Vacancy Transfer Probabilities ofTin Compounds

2019 ◽  
Vol 2 (1) ◽  
Author(s):  
Ahmet Tursucu ◽  
Mehmet Haskul ◽  
Asaf Tolga Ulgen
Keyword(s):  
Gamma Rays ◽  
Chemical Effect ◽  
X Rays ◽  
Tin Compounds ◽  
X Ray ◽  
Chemical Effects ◽  
Fluorescence Efficiency ◽  
Non Destructive ◽  
Transfer Probability

In the current work, it was investigated to the K X-ray fluorescence efficiency and chemical effect on vacancy transfer probability for some tin compounds. We used Br2Tin, TinI2, SeTin, TinF2, TinSO4, TinCl2, TinO and TinS compounds for experimental study. The target samples were irradiated with 241Am annular radioactive source at the intensity of 5 Ci which emits gamma rays at wavelength of 0.2028 nm. The characteristic x-rays emitted because of the excitation are collected by a high-resolution HPGe semiconductor detector. It has been determined that the experimental calculations of the tin (Sn) element are compatible with the theoretical calculation. In addition, we have calculated the experimental intensity ratios, fluorescence yields and total vacancy transfer probabilitiesfor other Sn compounds. 

scholarly journals Non-Destructive Determination of Chemical Effects onFluorescence Yields and Vacancy Transfer Probabilities ofTin Compounds

2018 ◽  
Author(s):  
Ahmet Tursucu ◽  
Mehmet Haskul ◽  
Asaf Tolga Ulgen
Keyword(s):  
Gamma Rays ◽  
Chemical Effect ◽  
X Rays ◽  
Tin Compounds ◽  
X Ray ◽  
Chemical Effects ◽  
Fluorescence Efficiency ◽  
Non Destructive ◽  
Transfer Probability

In the current work, it was investigated to the K X-ray fluorescence efficiency and chemical effect on vacancy transfer probability for some tin compounds. We used Br2Tin, TinI2, SeTin, TinF2, TinSO4, TinCl2, TinO and TinS compounds for experimental study. The target samples were irradiated with 241Am annular radioactive source at the intensity of 5 Ci which emits gamma rays at wavelength of 0.2028 nm. The characteristic x-rays emitted because of the excitation are collected by a high-resolution HPGe semiconductor detector. It has been determined that the experimental calculations of the tin (Sn) element are compatible with the theoretical calculation. In addition, we have calculated the experimental intensity ratios, fluorescence yields and total vacancy transfer probabilitiesfor other Sn compounds. 

scholarly journals Non-Destructive Determination of Chemical Effects onFluorescence Yields and Vacancy Transfer Probabilities ofTin Compounds

2018 ◽  
Vol 1 (3) ◽  
Author(s):  
Ahmet Tursucu ◽  
Mehmet Haskul ◽  
Asaf Tolga Ulgen
Keyword(s):  
Gamma Rays ◽  
Chemical Effect ◽  
X Rays ◽  
Tin Compounds ◽  
X Ray ◽  
Chemical Effects ◽  
Fluorescence Efficiency ◽  
Non Destructive ◽  
Transfer Probability

In the current work, it was investigated to the K X-ray fluorescence efficiency and chemical effect on vacancy transfer probability for some tin compounds. We used Br2Tin, TinI2, SeTin, TinF2, TinSO4, TinCl2, TinO and TinS compounds for experimental study. The target samples were irradiated with 241Am annular radioactive source at the intensity of 5 Ci which emits gamma rays at wavelength of 0.2028 nm. The characteristic x-rays emitted because of the excitation are collected by a high-resolution HPGe semiconductor detector. It has been determined that the experimental calculations of the tin (Sn) element are compatible with the theoretical calculation. In addition, we have calculated the experimental intensity ratios, fluorescence yields and total vacancy transfer probabilitiesfor other Sn compounds. 

The Measurement of Elastic Constants for the Determination of Stresses by X-Rays

1983 ◽  
Vol 27 ◽  
pp. 159-170 ◽  
Author(s):  
K. Perry ◽  
I.C. Noyan ◽  
P.J. Rudnik ◽  
J.B. Cohen
Keyword(s):  
Interplanar Spacing ◽  
Measuring System ◽  
Laboratory System ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Measured Change ◽  
Non Destructive ◽  
Applied Stresses

Residual and applied stresses (σij) are often measured via X-ray diffraction, by calculating the resultant elastic strains (ϵij) from the measured change in interplanar spacing (“d”). This method is non-destructive, reasonably reproducible (typically ±14 MPa), can be carried out in the field, and is readily automated to give values to an operator-specified precision , Let Li represent the axes of the measuring system with L3 normal to the diffracting planes, and Pi represent the sample axes. These axes are illustrated in Figure 1. In what follows, primed stresses and strains are in the laboratory system, while unprimed values are in the sample system.

Interface Roughness Determined by Diffuse Scattering and by Reflectivity of Hard X-Rays

1992 ◽  
Vol 280 ◽  
Author(s):  
B. Lengeler ◽  
M. Hüppauff
Keyword(s):  
Born Approximation ◽  
Diffuse Scattering ◽  
Interface Roughness ◽  
X Rays ◽  
Distorted Wave ◽  
Distorted Wave Born Approximation ◽  
X Ray ◽  
Non Destructive

ABSTRACTX-ray reflectivity and diffuse scattering are powerful techniques for the non-destructive determination of the vertical and lateral roughness of external and internal interfaces. The influence of roughness on the reflected and transmitted amplitudes is treated in terms of a model first described by Névot and Croce. The diffuse scattering is described by an improved distorted wave Born approximation. A few examples will demonstrate the possibilities of the techniques.

CHEMICAL EFFECTS OF X-RAYS

1992 ◽  
Vol 02 (02) ◽  
pp. 93-106 ◽  
Author(s):  
K. YOSHIHARA ◽  
J. IIHARA
Keyword(s):  
Energy Shift ◽  
Emission Probability ◽  
Chemical Effect ◽  
X Rays ◽  
Satellite Formation ◽  
X Ray ◽  
Chemical Effects ◽  
Production Techniques ◽  
Profile Change

Various aspects of chemical effects on X-ray spectra such as energy shift, emission probability change, satellite formation and peak profile change are reviewed in recent studies. Applicability of the chemical effect to analysis of practical samples is also discussed. Though the emphasis is laid on PIXE, other X-ray production techniques are also taken into consideration because new trends of X-ray production and measurement are growing.

Problems in Thin-Film X-ray Quantification

1990 ◽  
Vol 48 (2) ◽  
pp. 458-459
Author(s):  
J N Chapman ◽  
W A P Nicholson
Keyword(s):  
Thin Film ◽  
Specimen Thickness ◽  
X Rays ◽  
Characteristic Peak ◽  
Local Composition ◽  
X Ray ◽  
Measured Ratio ◽  
Path Lengths ◽  
Composition Changes

Energy dispersive x-ray microanalysis (EDX) is widely used for the quantitative determination of local composition in thin film specimens. Extraction of quantitative data is usually accomplished by relating the ratio of the number of atoms of two species A and B in the volume excited by the electron beam (nA/nB) to the corresponding ratio of detected characteristic photons (NA/NB) through the use of a k-factor. This leads to an expression of the form nA/nB = kAB NA/NB where kAB is a measure of the relative efficiency with which x-rays are generated and detected from the two species.Errors in thin film x-ray quantification can arise from uncertainties in both NA/NB and kAB. In addition to the inevitable statistical errors, particularly severe problems arise in accurately determining the former if (i) mass loss occurs during spectrum acquisition so that the composition changes as irradiation proceeds, (ii) the characteristic peak from one of the minority components of interest is overlapped by the much larger peak from a majority component, (iii) the measured ratio varies significantly with specimen thickness as a result of electron channeling, or (iv) varying absorption corrections are required due to photons generated at different points having to traverse different path lengths through specimens of irregular and unknown topography on their way to the detector.

Stoichiometric Determination of Graphite Intercalation Compounds Using Rutherford Backscatiering Spectrometry

1983 ◽  
Vol 27 ◽  
Author(s):  
L. Salamanca-Riba ◽  
B.S. Elman ◽  
M.S. Dresselhaus ◽  
T. Venkatesan
Keyword(s):  
Experimental Error ◽  
Rutherford Backscattering Spectrometry ◽  
Rutherford Backscattering ◽  
Intercalation Compounds ◽  
Graphite Intercalation Compounds ◽  
X Ray ◽  
Donor And Acceptor ◽  
Graphite Intercalation ◽  
Non Destructive

ABSTRACTRutherford backscattering spectrometry (RBS) is used to characterize the stoichiometry of graphite intercalation compounds (GIC). Specific application is made to several stages of different donor and acceptor compounds and to commensurate and incommensurate intercalants. A deviation from the theoretical stoichiometry is measured for most of the compounds using this non-destructive method. Within experimental error, the RBS results agree with those obtained from analysis of the (00ℓ) x-ray diffractograms and weight uptake measurements on the same samples.

scholarly journals More than XRF Mapping: STEAM (Statistically Tailored Elemental Angle Mapper) a Pioneering Analysis Protocol for Pigment Studies

2021 ◽  
Vol 11 (4) ◽  
pp. 1446
Author(s):  
Jacopo Orsilli ◽  
Anna Galli ◽  
Letizia Bonizzoni ◽  
Michele Caccia
Keyword(s):  
Cultural Heritage ◽  
Element Distribution ◽  
Elemental Distribution ◽  
X Rays ◽  
Spectral Angle Mapper ◽  
X Ray ◽  
Fluorescence Radiation ◽  
Set Up ◽  
Non Destructive ◽  
Analysis Protocol

Among the possible variants of X-Ray Fluorescence (XRF), applications exploiting scanning Macro-XRF (MA-XRF) are lately widespread as they allow the visualization of the element distribution maintaining a non-destructive approach. The surface is scanned with a focused or collimated X-ray beam of millimeters or less: analyzing the emitted fluorescence radiation, also elements present below the surface contribute to the elemental distribution image obtained, due to the penetrative nature of X-rays. The importance of this method in the investigation of historical paintings is so obvious—as the elemental distribution obtained can reveal hidden sub-surface layers, including changes made by the artist, or restorations, without any damage to the object—that recently specific international conferences have been held. The present paper summarizes the advantages and limitations of using MA-XRF considering it as an imaging technique, in synergy with other hyperspectral methods, or combining it with spot investigations. The most recent applications in the cultural Heritage field are taken into account, demonstrating how obtained 2D-XRF maps can be of great help in the diagnostic applied on Cultural Heritage materials. Moreover, a pioneering analysis protocol based on the Spectral Angle Mapper (SAM) algorithm is presented, unifying the MA-XRF standard approach with punctual XRF, exploiting information from the mapped area as a database to extend the comprehension to data outside the scanned region, and working independently from the acquisition set-up. Experimental application on some reference pigment layers and a painting by Giotto are presented as validation of the proposed method.

scholarly journals Electronic Excitations and Radiation Damage in Macromolecular Crystallography

Crystals ◽  
2018 ◽  
Vol 8 (7) ◽  
pp. 273 ◽  
Author(s):  
José Brandão-Neto ◽  
Leonardo Bernasconi
Keyword(s):  
Chemical Information ◽  
X Rays ◽  
Electronic Excitations ◽  
Macromolecular Crystallography ◽  
X Ray Diffraction ◽  
X Ray ◽  
Atomic Structures ◽  
Successful Approach ◽  
Structural Research

Macromolecular crystallography at cryogenic temperatures has so far provided the majority of the experimental evidence that underpins the determination of the atomic structures of proteins and other biomolecular assemblies by means of single crystal X-ray diffraction experiments. One of the core limitations of the current methods is that crystal samples degrade as they are subject to X-rays, and two broad groups of effects are observed: global and specific damage. While the currently successful approach is to operate outside the range where global damage is observed, specific damage is not well understood and may lead to poor interpretation of the chemistry and biology of the system under study. In this work, we present a phenomenological model in which specific damage is understood as the result of a single process, the steady excitation of crystal electrons caused by X-ray absorption, which acts as a trigger for the bulk effects that manifest themselves in the form of global damage and obscure the interpretation of chemical information from XFEL and synchrotron structural research.

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