In-Situ Transmission Electron Microscopy Observation of Electromigration in Au Thin Wires

2012 ◽  
Vol 12 (11) ◽  
pp. 8741-8745
Author(s):  
Yosuke Murakami ◽  
Masashi Arita ◽  
Kouichi Hamada ◽  
Yasuo Takahashi
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