Sintering Behaviors of Au Nanopowders with Different Particle Sizes: A Real-Time Synchrotron X-ray Scattering Study

2020 ◽  
Vol 20 (1) ◽  
pp. 415-419
Author(s):  
Jang-Hyeong Lee ◽  
Sae-Heum Park ◽  
Tae-Sik Cho
Keyword(s):  
Real Time ◽  
Particle Sizes ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Ray Scattering

Sintering Behaviors of Ag Nanopowders with Different Particle Sizes: A Real-Time Synchrotron X-ray Scattering Study

2017 ◽  
Vol 17 (10) ◽  
pp. 7799-7803
Author(s):  
Joo-Hyeon Jeong ◽  
Tae-Sik Cho
Keyword(s):  
Real Time ◽  
Particle Sizes ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Ray Scattering

Oxidation Behaviors of Aluminum Nanopowders with Different Particle Sizes: A Real-Time Synchrotron X-ray Scattering Study

2021 ◽  
Vol 21 (3) ◽  
pp. 1784-1788
Author(s):  
Nan-Nan Liang ◽  
Sae-Heum Park ◽  
Tae-Sik Cho
Keyword(s):  
Particle Size ◽  
Real Time ◽  
Particle Sizes ◽  
Large Particle Size ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Al Oxide ◽  
Oxidation Behaviors ◽  
Ray Scattering

We have studied the oxidation behaviors of aluminum (Al) nanopowders with different particle sizes using a real-time synchrotron X-ray scattering during annealing in air. The Al nanopowders with small particle size of 78 nm at room temperature (RT) were a single crystal. The surface of the nanopowders was first oxidized to amorphous Al oxide near 450 °C, and then crystallized to γ-Al2O3 phase at 550 °C. The inside of the nanopowders existed as crystal Al phase at 680 °C, high compared to the melting temperature of Al bulk, 660 °C. In contrast, the Al nanopowders with large particle size of 816 nm at RT have multi grains inside a particle. The surface and grain boundary of the powders were first oxidized to amorphous Al oxide near 470 °C, and then crystallized to γ-Al2O3 phase at 550 °C. The inside of the powders existed as amorphous Al phase at 620 °C, melted at 656 °C, and then oxidized gradually above 656 °C.

scholarly journals Twin formation in sputter-grown ZnO∕Al2O3(0001) epitaxial film: A real time x-ray scattering study

2004 ◽  
Vol 22 (5) ◽  
pp. 2159-2162 ◽  
Author(s):  
I. W. Kim ◽  
Y. B. Kwon ◽  
J. M. Yi ◽  
J. H. Je ◽  
G. Nouet ◽  
...  
Keyword(s):  
Real Time ◽  
Epitaxial Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Twin Formation ◽  
Ray Scattering

Crystallization of amorphous precursor of Ba-ferrite film: a real-time synchrotron X-ray scattering study

1999 ◽  
Vol 35 (5) ◽  
pp. 2778-2780 ◽  
Author(s):  
Tae Sik Cho ◽  
Seok Joo Doh ◽  
Jung Ho Je ◽  
Do Young Noh ◽  
Tak Jean Moon
Keyword(s):  
Real Time ◽  
Ferrite Film ◽  
Amorphous Precursor ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Ray Scattering

Selenization of (Cu, In, Ga)/Se/Mo/Glass Thin Films: A Real-Time Synchrotron X-ray Scattering Study

2017 ◽  
Vol 17 (5) ◽  
pp. 3566-3570
Author(s):  
Yeon Su Son ◽  
Tae Sik Cho
Keyword(s):  
Thin Films ◽  
Real Time ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Ray Scattering

A Real-Time Simultaneous Small- and Wide-Angle X-ray Scattering Study of In-Situ Deformation of Isotropic Polyethylene

1995 ◽  
Vol 28 (19) ◽  
pp. 6383-6393 ◽  
Author(s):  
Michael F. Butler ◽  
Athene M. Donald ◽  
Wim Bras ◽  
Geoffrey R. Mant ◽  
Gareth E. Derbyshire ◽  
...  
Keyword(s):  
Real Time ◽  
Wide Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
In Situ Deformation ◽  
Ray Scattering

Real time X-ray scattering study during the thermal conversion of a precursor polymer to poly(p-phenylene vinylene)

1991 ◽  
Vol 41 (1-2) ◽  
pp. 269
Author(s):  
T.A. Ezquerra ◽  
E. Lopez-Cabarcos ◽  
F.J. Baltà-Calleja ◽  
J.D. Stenger-Smith ◽  
R.W. Lenz
Keyword(s):  
Real Time ◽  
Thermal Conversion ◽  
Phenylene Vinylene ◽  
X Ray ◽  
Precursor Polymer ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Ray Scattering

Shear-Induced Crystallization of Poly(butylene terephthalate):  A Real-Time Small-Angle X-ray Scattering Study

2004 ◽  
Vol 37 (15) ◽  
pp. 5646-5652 ◽  
Author(s):  
Liangbin Li ◽  
Wim H. de Jeu
Keyword(s):  
Real Time ◽  
Small Angle ◽  
Butylene Terephthalate ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Induced Crystallization ◽  
Ray Scattering

Real-time x-ray scattering study of homoepitaxial growth of SrTiO3 by sputtering

2002 ◽  
Vol 749 ◽  
Author(s):  
Hsin-Yi Lee ◽  
C.-H. Hsu ◽  
Y.-W. Hsieh ◽  
K. S. Liang
Keyword(s):  
Real Time ◽  
Bragg Peak ◽  
Epitaxial Relationship ◽  
X Ray ◽  
Homoepitaxial Growth ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Sputter Deposited ◽  
Ray Scattering

ABSTRACTThe real-time x-ray scattering measurements under in-situ sputtering conditions were employed to study the growth behavior of sputter-deposited SrTiO3 films on SrTiO3 (001) substrate. A condition for conformal growth between deposited layers and substrate was found by observing the oscillation fringe in the diffuse scattering of measured reflectivity. The azimuthal scan around surface Bragg peak of the film peak shows that the epitaxial relationship between film and substrate can be achieved by sputtering.

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