Inhibition of scale growth on 20Cr–25Ni–Nb stabilized stainless steel by yttrium ion implantation revealed by analytical electron microscopy

1988 ◽  
Vol 4 (12) ◽  
pp. 1107-1113 ◽  
Author(s):  
M. J. Bennett ◽  
J. A. Desport ◽  
M. R. Houlton ◽  
P. A. Labun ◽  
J. M. Titchmarsh
Keyword(s):  
Electron Microscopy ◽  
Stainless Steel ◽  
Ion Implantation ◽  
Analytical Electron Microscopy ◽  
Scale Growth ◽  
Analytical Electron ◽  
Yttrium Ion

Analytical Electron Microscopy of Ion-Implanted Metals

1985 ◽  
Vol 43 ◽  
pp. 282-285
Author(s):  
D.I. Potter ◽  
M. Ahmed ◽  
K. Ruffing
Keyword(s):  
Electron Microscopy ◽  
Ion Implantation ◽  
Friction And Wear ◽  
Analytical Electron Microscopy ◽  
Chemical Compositions ◽  
Surface Chemical ◽  
Near Surface ◽  
The Past ◽  
Analytical Electron ◽  
Property Changes

Ion implantation, used extensively for the past decade in fabricating semiconductor devices, now provides a unique means for altering the near-surface chemical compositions and microstructures of metals. These alterations often significantly improve physical properties that depend on the surface of the material; for example, catalysis, corrosion, oxidation, hardness, friction and wear. Frequently the mechanisms causing these beneficial alterations and property changes remain obscure and much of the current research in the area of ion implantation metallurgy is aimed at identifying such mechanisms. Investigators thus confront two immediate questions: To what extent is the chemical composition changed by implantation? What is the resulting microstructure? These two questions can be investigated very fruitfully with analytical electron microscopy (AEM), as described below.

Second Phase Formation in Aluminum annealed after Ion Implantation with Molybdenum.

1983 ◽  
Vol 27 ◽  
Author(s):  
J. Bentley ◽  
L. D. Stephenson ◽  
R. B. Benson ◽  
P. A. Parrish ◽  
J. K. Hirvonen
Keyword(s):  
Electron Microscopy ◽  
Ion Implantation ◽  
Phase Transformations ◽  
Phase Formation ◽  
Analytical Electron Microscopy ◽  
Second Phase ◽  
Continuous Film ◽  
Video Recordings ◽  
Analytical Electron ◽  
Annealing Experiments

ABSTRACTThe microstructure of aluminum annealed after implantation to peak concentrations of approximately 4.4 and 11 at. % Mo was investigated by analytical electron microscopy. Al12Mo precipitates formed with pseudo-lamellar and continuous film microstructures. Video recordings of insitu annealing experiments revealed the details of the phase transformations.

Precipitation at α/γ interfaces in duplex stainless steel

1992 ◽  
Vol 50 (1) ◽  
pp. 60-61
Author(s):  
M.G. Burke ◽  
E.A. Kenik
Keyword(s):  
Electron Microscopy ◽  
Stainless Steel ◽  
Grain Boundaries ◽  
Duplex Stainless Steel ◽  
Stainless Steels ◽  
Analytical Electron Microscopy ◽  
Nuclear Industry ◽  
Temperature Range ◽  
Α Phase ◽  
Analytical Electron

Duplex (austenite/ferrite) stainless steels are used in a variety of applications in the nuclear industry, particularly for coolant pipes, valves and pumps. These materials may become embrittled after prolonged ageing in the temperature range ∼350 - 550°C due to precipitation of G-phase, an FCC-based Ni silicide, and the formation of a Cr-rich α' phase in the ferrite. In addition to the intragranular G-phase precipitates, preferential precipitation of other phases is often observed at grain boundaries, particularly α/γ interfaces. In this examination, the precipitates formed in a Nb-containing duplex stainless steel have been identified using analytical electron microscopy.

scholarly journals Precipitation and “Sensitization” of Type 304L Stainless Steel: Correlation of the ASTM A262 Practice A Test with Analytical Electron Microscopy

2011 ◽  
Vol 17 (S2) ◽  
pp. 1020-1021
Author(s):  
B Miller ◽  
M Burke
Keyword(s):  
Electron Microscopy ◽  
Stainless Steel ◽  
Analytical Electron Microscopy ◽  
304L Stainless Steel ◽  
Analytical Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Application of Analytical Electron Microscopy to Ion Implantation and Near Surface Microstructures

1985 ◽  
Vol 62 ◽  
Author(s):  
P. S. Sklad
Keyword(s):  
Electron Microscopy ◽  
Ion Implantation ◽  
Ion Beam ◽  
Analytical Electron Microscopy ◽  
Theoretical Models ◽  
Solute Concentration ◽  
Specimen Preparation ◽  
Second Phase ◽  
Near Surface ◽  
Analytical Electron

ABSTRACTSurface modification using ion beam techniques is recognized as an important method for improving surface controlled properties of metallic, ceramic, and semiconductor materials. Determination of the microstructure and composition in regions located within a few hundred nanometers of the surface is essential to gaining an understanding of the mechanisms responsible for the improved properties. Analytical electron microscopy (AEM), high resolution microscopy, and microdiffraction are ideally suited for this purpose. These techniques are powerful tools for characterizing microstructure in terms of solute concentration profiles, second phase formation, lattice damage, crystallinity of the implanted layer and annealing behavior. Such analyses allow correlations with theoretical models, property measurements and results of complementary techniques. The proximity of the regions of interest to the surface also places stringent requirements on specimen preparation techniques. The power of AEM in examining the effects of ion implantation will be illustrated by reviewing the results of several investigations. A brief discussion of some important aspects of specimen preparation will also be included.

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