Heavy Doping Effects in Silicon

Author(s):  
P. Van Mieghem ◽  
R.P. Mertens
Keyword(s):  
1994 ◽  
Vol 37 (10) ◽  
pp. 1775-1777
Author(s):  
S.S. De ◽  
A.K. Ghosh ◽  
A.K. Hajra ◽  
M. Bera ◽  
J.C. Haldar

1982 ◽  
Vol 113 (2) ◽  
pp. 757-778 ◽  
Author(s):  
H. van Cong ◽  
S. Charar ◽  
S. Brunet ◽  
M. Averous ◽  
J. L. Birman

1993 ◽  
Vol 73 (2) ◽  
pp. 691-698 ◽  
Author(s):  
A. Nylandsted Larsen ◽  
K. Kyllesbech Larsen ◽  
P. E. Andersen ◽  
B. G. Svensson
Keyword(s):  
Group Iv ◽  

1990 ◽  
Vol 13 (1-2) ◽  
pp. 75-82
Author(s):  
Seishu Bendapudi ◽  
D N Bose
Keyword(s):  

1990 ◽  
Vol 29 (Part 1, No. 10) ◽  
pp. 1900-1907 ◽  
Author(s):  
Koki Saito ◽  
Makoto Konagai ◽  
Kiyoshi Takahashi

1993 ◽  
Vol 71 (11-12) ◽  
pp. 582-585
Author(s):  
S. S. De ◽  
A. K. Ghosh ◽  
M. Bera ◽  
A. K. Hazra ◽  
J. C. Haldar

A model is developed to study the carrier lifetime and quantum efficiency in heavily doped InGaAsP. In the analysis, bandgap narrowing, carrier degeneracy, and nonparabolicity of the band structure are considered as heavy doping effects. The variations of carrier lifetime and quantum efficiency with nominal current density at a given temperature are studied through numerical analysis.


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