A test point selection method based on recognition of typical topology structure of complex networks

2017 ◽  
Author(s):  
Wenzhe Li ◽  
Junyou Shi ◽  
Xiaowei Duan ◽  
Xuhao Guo
Keyword(s):  
Complex Networks ◽  
Selection Method ◽  
Test Point ◽  
Point Selection ◽  
Topology Structure ◽  
Test Point Selection

A Novel Test Point Selection Method for Analog Fault Dictionary Techniques

2010 ◽  
Vol 26 (5) ◽  
pp. 523-534 ◽  
Author(s):  
ChengLin Yang ◽  
ShuLin Tian ◽  
Bing Long ◽  
Fang Chen
Keyword(s):  
Selection Method ◽  
Test Point ◽  
Point Selection ◽  
Fault Dictionary ◽  
Test Point Selection

scholarly journals Test Point Selection Method for Analog Circuit Fault Diagnosis Based on Similarity Coefficient

2018 ◽  
Vol 2018 ◽  
pp. 1-11 ◽  
Author(s):  
Qingfeng Ma ◽  
Yuzhu He ◽  
Fuqiang Zhou ◽  
Ping Song
Keyword(s):  
Analog Circuit ◽  
Selection Method ◽  
Test Point ◽  
Similarity Coefficient ◽  
Fault Isolation ◽  
Point Selection ◽  
Testability Analysis ◽  
Test Point Selection ◽  
Point Set ◽  
Circuit Fault Diagnosis

The demand for testability analysis has increased with the integration densities and complexity of circuits. As an important part of testability analysis, the test point selection method needs to be researched in depth. A new similarity coefficient criterion is proposed to determine the fault isolation degree because output responses of a circuit with component tolerance are approximately subject to the normal distribution. Then, a new test point selection method is proposed based on the fault-pair similarity coefficient criterion information table. Simulation experiments are used to validate the accuracy of the proposed method in terms of the optimum test point set and fault isolation degree. The results show that the proposed method improves the performance of test point selection by comparing with the other reported methods.

Optimal Selection Method of Test Points on Circuit Board Level

2014 ◽  
Vol 1006-1007 ◽  
pp. 1125-1128
Author(s):  
Xiu Sheng Duan ◽  
Sheng Jun Li ◽  
Jing Xiao ◽  
Jie Wang
Keyword(s):  
Fault Diagnosis ◽  
Feature Selection Method ◽  
Selection Method ◽  
Test Point ◽  
Circuit Board ◽  
Optimal Selection ◽  
Point Selection ◽  
Test Point Selection ◽  
Test Points ◽  
Board Level

Test point selection is the basic problem of fault diagnosis systems. It is also one of the key links in designing the condition monitoring system. Aiming at the optimizing the test points on circuit board level, an optimal selection method is proposed. It is the method which combines the SVM algorithm and the feature selection method. The principle and process of the method are discussed in detail and in the fault diagnosis experiment of a circuit board, the effectiveness is verified finally.

A New Test Point Selection Method for Analog Continuous Parameter Fault

2017 ◽  
Vol 33 (3) ◽  
pp. 339-352 ◽  
Author(s):  
Hui Luo ◽  
Wei Lu ◽  
Youren Wang ◽  
Ling Wang
Keyword(s):  
Selection Method ◽  
Test Point ◽  
Point Selection ◽  
Continuous Parameter ◽  
Test Point Selection
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