Optimal Selection Method of Test Points on Circuit Board Level

2014 ◽  
Vol 1006-1007 ◽  
pp. 1125-1128
Author(s):  
Xiu Sheng Duan ◽  
Sheng Jun Li ◽  
Jing Xiao ◽  
Jie Wang
Keyword(s):  
Fault Diagnosis ◽  
Feature Selection Method ◽  
Selection Method ◽  
Test Point ◽  
Circuit Board ◽  
Optimal Selection ◽  
Point Selection ◽  
Test Point Selection ◽  
Test Points ◽  
Board Level

Test point selection is the basic problem of fault diagnosis systems. It is also one of the key links in designing the condition monitoring system. Aiming at the optimizing the test points on circuit board level, an optimal selection method is proposed. It is the method which combines the SVM algorithm and the feature selection method. The principle and process of the method are discussed in detail and in the fault diagnosis experiment of a circuit board, the effectiveness is verified finally.

scholarly journals Research on optimizing the fault diagnosis strategy of complex electronic equipment

2010 ◽  
Vol 7 (1) ◽  
pp. 223-230
Author(s):  
Hong-Xia Wang ◽  
Xiao-Hui Ye ◽  
Liang Wang
Keyword(s):  
Test Point ◽  
Electronic Equipment ◽  
Fault Detection And Isolation ◽  
Point Selection ◽  
Optimal Test ◽  
Test Information ◽  
Testing Sequence ◽  
Test Point Selection ◽  
Global Optimal ◽  
Test Points

Diagnosis strategy is a testing sequence of the fault detection and isolation. For the distribution of the electronic equipment, a feasible engineering maintenance method is put forward based on the questions of test point selection and diagnosis strategy. The concepts of local diagnosis strategy and global diagnosis strategy are introduced. From which the local optimal diagnosis strategy is determined when the local optimal test points have been introduced by using the test information entropy, furthermore, the global optimal diagnosis strategy is determined by coalescing the local optimal diagnosis strategies. At last, the validity of the method is illustrated by an example from which the conclusion can be drawn that it is an optimal diagnosis strategy and the complexity of computation can be reduced.

A Novel Test Point Selection Method for Analog Fault Dictionary Techniques

2010 ◽  
Vol 26 (5) ◽  
pp. 523-534 ◽  
Author(s):  
ChengLin Yang ◽  
ShuLin Tian ◽  
Bing Long ◽  
Fang Chen
Keyword(s):  
Selection Method ◽  
Test Point ◽  
Point Selection ◽  
Fault Dictionary ◽  
Test Point Selection
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