A survey on the highlight removal method of specular reflection surfaces

Iris recognition has been around for many years due to an extensive research on the uniqueness of human iris. It is well known that the iris is not similar to each other which means every human in the planet has their own iris pattern and cannot be shared. One of the main issues in iris recognition is iris segmentation. One element that can reduce the accuracy of iris segmentation is the presence of specular reflection. Another issue is the speed of specular reflection removal since the iris recognition system needs to process a lot of irises. In this paper, a specular reflection removal method was proposed to achieve a fast and accurate specular reflection removal. Some modifications were implemented on the existing pixels properties method. Based on the results, the proposed method achieved the fastest execution time, the highest segmentation accuracy and the highest SSIM compared to the other methods. This proves that the proposed method is fast and accurate to be implemented in the iris recognition systems.

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Forensic applications of IR infrared microscopic internal reflection spectroscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100132273 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1528-1529

Author(s):

Edward G. Bartick ◽

John A. Reffner

Keyword(s):

Specular Reflection ◽

Forensic Analysis ◽

Attenuated Total Reflection ◽

Internal Reflection ◽

Standard Size ◽

Ir Microscopy ◽

Ir Analysis ◽

Plastic Explosives ◽

Internal Reflection Spectroscopy ◽

Reflectance Measurements

Since the introduction of commercial Fourier transform infrared (FTIR) microscopic systems in 1983, IR microscopy has developed as an important analytical tool in research, industry and forensic analysis. Because of the frequent encounter of small quantities of physical evidence found at crime scenes, spectroscopic IR microscopes have proven particularly valuable for forensic applications. Transmittance and reflectance measurements have proven very useful. Reflection-absorption, specular reflection, and diffuse reflection have all been applied. However, it has been only very recently that an internal reflection (IRS) objective has been commercially introduced.The IRS method, also known as attenuated total reflection (ATR), has proven very useful for IR analysis of standard size samples. The method has been applied to adhesive tapes, plastic explosives, and general applications in the analysis of opaque materials found as evidence. The small quantities or uncontaminated areas of specimens frequently found requiring forensic analysis will often be directly applicable to microscopic IRS analysis.

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Valence electron energy loss spectroscopy in reflection geometry

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100153865 ◽

1989 ◽

Vol 47 ◽

pp. 378-379

Author(s):

J. Liu ◽

J. M. Cowley

Keyword(s):

Energy Loss ◽

Valence Electron ◽

Interband Transition ◽

Specular Reflection ◽

Three Dimensional ◽

Electron Excitation ◽

Transmission Electron ◽

Yield Information ◽

Valence Bands ◽

Excitation Processes

The low energy loss region of a EELS spectrum carries information about the valence electron excitation processes (e.g., collective excitations for free electron like materials and interband transitions for insulators). The relative intensities and the positions of the interband transition energy loss peaks observed in EELS spectra are determined by the joint density of states (DOS) of the initial and final states of the excitation processes. Thus it is expected that EELS in reflection mode could yield information about the perturbation of the DOS of the conduction and valence bands of the bulk crystals caused by the termination of the three dimensional periodicity at the crystal surfaces. The experiments were performed in a Philipps 400T transmission electron microscope operated at 120 kV. The reflection EELS spectra were obtained by a Gatan 607 EELS spectrometer together with a Tracor data acquisition system and the resolution of the spectrometer was about 0.8 eV. All the reflection spectra are obtained from the specular reflection spots satisfying surface resonance conditions.

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An Alternative to High-Temperature and Acid/Solvent-Based Methods for Removing Integrated Circuits from Ceramic or Other Problem Substrates

ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2005p0489 ◽

2005 ◽

Author(s):

Carl M. Nail

Keyword(s):

High Temperature ◽

Integrated Circuits ◽

Success Rate ◽

Mechanical Damage ◽

Test Equipment ◽

High Success Rate ◽

Automated Test Equipment ◽

Removal Method ◽

Automated Test ◽

Conventional Methods

Abstract Dice must often be removed from their packages and reassembled into more suitable packages for them to be tested in automated test equipment (ATE). Removing bare dice from their substrates using conventional methods poses risks for chemical, thermal, and/or mechanical damage. A new removal method is offered using metallography-based and parallel polishing-based techniques to remove the substrate while exposing the die to minimized risk for damage. This method has been tested and found to have a high success rate once the techniques are learned.

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A Residual Chlorine Removal Method to Allow Drinking Water Monitoring by Biological Early Warning Systems

10.21236/ada432455 ◽

2005 ◽

Cited By ~ 2

Author(s):

Willian H. VAN DER Schalie ◽

David E. Trader ◽

Mark W. Widder ◽

Tommy R. Shedd ◽

Linda M. Brennan

Keyword(s):

Drinking Water ◽

Early Warning ◽

Early Warning Systems ◽

Water Monitoring ◽

Residual Chlorine ◽

Warning Systems ◽

Removal Method ◽

Chlorine Removal

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Specular Reflection Image Enhancement Based on a Dark Channel Prior

IEEE Photonics Journal ◽

10.1109/jphot.2021.3053906 ◽

2021 ◽

Vol 13 (1) ◽

pp. 1-11

Author(s):

Ye Xin ◽

Zhenhong Jia ◽

Jie Yang ◽

Nikola K. Kasabov

Keyword(s):

Image Enhancement ◽

Specular Reflection ◽

Dark Channel Prior ◽

Dark Channel ◽

Reflection Image

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Real-time Approximation of Photometric Polygonal Lights

Proceedings of the ACM on Computer Graphics and Interactive Techniques ◽

10.1145/3384537 ◽

2020 ◽

Vol 3 (1) ◽

pp. 1-18

Author(s):

Christian Luksch ◽

Lukas Prost ◽

Michael Wimmer

Keyword(s):

Real Time ◽

Specular Reflection ◽

Near Field ◽

Measurement Data ◽

Data Sets ◽

Photometric Measurement ◽

Integration Technique ◽

Time Approximation ◽

Light Emitter ◽

Selection Of

We present a real-time rendering technique for photometric polygonal lights. Our method uses a numerical integration technique based on a triangulation to calculate noise-free diffuse shading. We include a dynamic point in the triangulation that provides a continuous near-field illumination resembling the shape of the light emitter and its characteristics. We evaluate the accuracy of our approach with a diverse selection of photometric measurement data sets in a comprehensive benchmark framework. Furthermore, we provide an extension for specular reflection on surfaces with arbitrary roughness that facilitates the use of existing real-time shading techniques. Our technique is easy to integrate into real-time rendering systems and extends the range of possible applications with photometric area lights.

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