ZnO Nanoparticles: Defect Structure, Space-Charge Depletion

2014 ◽  
pp. 397-417
2013 ◽  
Vol 06 (04) ◽  
pp. 1330004 ◽  
Author(s):  
RÜDIGER-A. EICHEL ◽  
EMRE ERDEM ◽  
PETER JAKES ◽  
ANDREW OZAROWSKI ◽  
JOHAN VAN TOL ◽  
...  

The defect structure of ZnO nanoparticles is characterized by means of high-field electron paramagnetic resonance (EPR) spectroscopy. Different point and complex defects could be identified, located at the "bulk" or the surface region of the nanoparticles. In particular, by exploiting the enhanced g-value resolution at a Larmor frequency of 406.4 GHz, it could be shown that the resonance commonly observed at g = 1.96 is comprised of several overlapping resonances from different defects. Based on the high-field EPR analysis, the development of a space-charge layer could be monitored that consists of (shallow) donor-type [Formula: see text] defects at the "bulk" and acceptor-type [Formula: see text] and complex [Formula: see text] defects at the surface. Application of a core-shell model allows to determine the thickness of the depletion layer to 1.0 nm for the here studied compounds [J.J. Schneider et al., Chem. Mater.22, 2203 (2010)].


Carbon ◽  
2019 ◽  
Vol 153 ◽  
pp. 381-388 ◽  
Author(s):  
Kang Liu ◽  
Sen Zhang ◽  
Benjian Liu ◽  
Mingqi Sun ◽  
Jiwen Zhao ◽  
...  

1973 ◽  
Vol 44 (7) ◽  
pp. 3055-3059 ◽  
Author(s):  
Oscar Biblarz ◽  
Carl M. Bohley

2012 ◽  
Vol 225 ◽  
pp. 304-307 ◽  
Author(s):  
M. Shirpour ◽  
R. Merkle ◽  
J. Maier

1987 ◽  
Vol 61 (3) ◽  
pp. 1038-1046 ◽  
Author(s):  
M. Abkowitz ◽  
S. Maitra

2011 ◽  
Vol 21 (15) ◽  
pp. 2901-2905 ◽  
Author(s):  
Chilin Li ◽  
Xiangxin Guo ◽  
Lin Gu ◽  
Dominik Samuelis ◽  
Joachim Maier

Author(s):  
Simon Luo ◽  
William White ◽  
Joseph M Cardon ◽  
Shane Ardo

Junctions that form at interfaces of electronic semiconductors can lead to space–charge depletion regions that result in diode behavior through current rectification. Space–charge regions are not unique to semiconductor interfaces...


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