Determining the electron-phonon coupling strength from Resonant Inelastic X-ray Scattering at transition metal L-edges
2011 ◽
Vol 95
(2)
◽
pp. 27008
◽
L. J. P. Ament
◽
M. van Veenendaal
◽
J. van den Brink
S. Fatale
◽
S. Moser
◽
J. Miyawaki
◽
Y. Harada
◽
M. Grioni
V. Ilakovac
◽
S. Carniato
◽
P. Foury-Leylekian
◽
S. Tomić
◽
J.-P. Pouget
◽
...
Lucio Braicovich
◽
Matteo Rossi
◽
Roberto Fumagalli
◽
Yingying Peng
◽
Yan Wang
◽
...
J. G. Vale
◽
C. D. Dashwood
◽
E. Paris
◽
L. S. I. Veiga
◽
M. Garcia-Fernandez
◽
...
T. P. Devereaux
◽
A. M. Shvaika
◽
K. Wu
◽
K. Wohlfeld
◽
C. J. Jia
◽
...
Yu‐Cheng Shao
◽
Cheng‐Tai Kuo
◽
Xuefei Feng
◽
Yi‐De Chuang
◽
Tae Jun Seok
◽
...
D. Meyers
◽
Ken Nakatsukasa
◽
Sai Mu
◽
Lin Hao
◽
Junyi Yang
◽
...
2013 ◽
Vol 52
(12)
◽
pp. 6767-6769
◽
Weibing Dong
◽
Hongxin Wang
◽
Marilyn M. Olmstead
◽
James C. Fettinger
◽
Jay Nix
◽
...
2017 ◽
Vol 345
◽
pp. 182-208
◽
Michael L. Baker
◽
Michael W. Mara
◽
James J. Yan
◽
Keith O. Hodgson
◽
Britt Hedman
◽
...