Two- and Three-Dimensional Analyses of Surfaces According to the E-System
1974 ◽
Vol 188
(1)
◽
pp. 691-699
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Keyword(s):
The E-system of roughness measurement can be used either for a two-dimensional or a three-dimensional assessment of surface roughness. The procedure for computing the two- and three-dimensional envelopes from digitized profiles is briefly explained. This method will be useful for verifying the results obtained by practical instruments. The filtering characteristic of the E-system, when used for two- and three-dimensional roughness measurement, is analysed with reference to theoretical profiles. Various skid configurations are studied using a doubly curved skid simulated by a computer.
2017 ◽
Vol 35
(1)
◽
pp. 357-362
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2019 ◽
Vol 44
(10)
◽
pp. 1041-1048
1979 ◽
Vol 1
(3)
◽
pp. 166-168
◽
Keyword(s):
2006 ◽
Vol 76
(11)
◽
pp. 828-834
◽
Keyword(s):
2001 ◽
Vol 67
(653)
◽
pp. 254-261
◽
1995 ◽
Vol 66
(3)
◽
pp. 2504-2507
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