scholarly journals Features Deletion on Multiple Objects Recognition using Speeded-Up Robust Features, Scale Invariant Feature Transform and Randomized KD-Tree

Author(s):  
Samuel Alvin Hutama ◽  
Saptadi Nugroho ◽  
Darmawan Utomo
2018 ◽  
Vol 7 (2.8) ◽  
pp. 353
Author(s):  
A Roshna Meeran ◽  
V Nithya

The paper focuses on the investigation of image processing of Electronic waste detection and identification in recycling process of all Electronic items. Some of actually collected images of E-wastes would be combined with other wastes. For object matching with scale in-variance the SIFT (Scale -Invariant- Feature Transform) is applied. This method detects the electronic waste found among other wastes and also estimates the amount of electronic waste detected the give set of wastes. The detection of electronics waste by this method is most efficient ways to detect automatically without any manual means.


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