A207 Friction measurements of articular cartilage using an atomic force microscope subjected to lateral force calibration

2015 ◽  
Vol 2015.26 (0) ◽  
pp. 85-86
Author(s):  
Taishi Kobayashi ◽  
Hiromichi Fujie
Keyword(s):  
Articular Cartilage ◽  
Atomic Force Microscope ◽  
Lateral Force ◽  
Atomic Force ◽  
Friction Measurements ◽  
Force Calibration

Method for lateral force calibration in atomic force microscope using MEMS microforce sensor

2017 ◽  
Vol 182 ◽  
pp. 1-9 ◽  
Author(s):  
Cezary Dziekoński ◽  
Wojciech Dera ◽  
Dariusz M. Jarząbek
Keyword(s):  
Atomic Force Microscope ◽  
Lateral Force ◽  
Atomic Force ◽  
Force Calibration

Lateral force calibration for atomic force microscope cantilevers using a suspended nanowire

2020 ◽  
Vol 31 (47) ◽  
pp. 475703
Author(s):  
Guangjie Zhang ◽  
Peng Li ◽  
Dawei Wei ◽  
Kui Hu ◽  
Xiaohui Qiu
Keyword(s):  
Atomic Force Microscope ◽  
Lateral Force ◽  
Atomic Force ◽  
Force Calibration

Sliding Friction by Atomic Force Microscopy

1998 ◽  
Vol 543 ◽  
Author(s):  
V. Pasquier ◽  
J. M. Drake
Keyword(s):  
Atomic Force Microscopy ◽  
Sliding Friction ◽  
Lateral Force ◽  
Lateral Force Microscopy ◽  
Force Microscopy ◽  
Load Dependence ◽  
Silica Surfaces ◽  
Atomic Force ◽  
Friction Measurements ◽  
Force Calibration

AbstractLateral Force Microscopy offers the possibility of exploring tribological properties of interfaces atthe nanoscale. Our research focused on some crucial conditions that must be fuffilled to obtainquantitative and reliable LFM friction measurements. We have characterized the mechanical andvibrational properties of the cantilever. Precise force calibration were made based on ourknowledge of the intrinsic coupling modes of the cantilever. We report measurements of the slidingfriction between two silica surfaces. The load dependence of the friction force was analyzedassuming different models for the contact, from Hertzian to Amontons law.

Quantitative comparison of two independent lateral force calibration techniques for the atomic force microscope

2012 ◽  
Vol 83 (2) ◽  
pp. 023707 ◽  
Author(s):  
Sarice S. Barkley ◽  
Zhao Deng ◽  
Richard S. Gates ◽  
Mark G. Reitsma ◽  
Rachel J. Cannara
Keyword(s):  
Atomic Force Microscope ◽  
Lateral Force ◽  
Quantitative Comparison ◽  
Atomic Force ◽  
Force Calibration ◽  
Calibration Techniques

Friction measurements on phase-separated thin films with a modified atomic force microscope

Nature ◽  
1992 ◽  
Vol 359 (6391) ◽  
pp. 133-135 ◽  
Author(s):  
R. M. Overney ◽  
E. Meyer ◽  
J. Frommer ◽  
D. Brodbeck ◽  
R. Lüthi ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscope ◽  
Atomic Force ◽  
Friction Measurements

Traceable Lateral Force Calibration (TLFC) for Atomic Force Microscopy

2020 ◽  
Vol 68 (4) ◽  
Author(s):  
Arnab Bhattacharjee ◽  
Nikolay T. Garabedian ◽  
Christopher L. Evans ◽  
David L. Burris
Keyword(s):  
Atomic Force Microscopy ◽  
Lateral Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Calibration
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