Quantitative comparison of two independent lateral force calibration techniques for the atomic force microscope

2012 ◽  
Vol 83 (2) ◽  
pp. 023707 ◽  
Author(s):  
Sarice S. Barkley ◽  
Zhao Deng ◽  
Richard S. Gates ◽  
Mark G. Reitsma ◽  
Rachel J. Cannara
Keyword(s):  
Atomic Force Microscope ◽  
Lateral Force ◽  
Quantitative Comparison ◽  
Atomic Force ◽  
Force Calibration ◽  
Calibration Techniques

Method for lateral force calibration in atomic force microscope using MEMS microforce sensor

2017 ◽  
Vol 182 ◽  
pp. 1-9 ◽  
Author(s):  
Cezary Dziekoński ◽  
Wojciech Dera ◽  
Dariusz M. Jarząbek
Keyword(s):  
Atomic Force Microscope ◽  
Lateral Force ◽  
Atomic Force ◽  
Force Calibration

A Comparison of Lateral Calibration Techniques for Quantitative Friction Force Microscopy

2005 ◽  
Author(s):  
K. S. Kanaga Karuppiah ◽  
Sriram Sundararajan
Keyword(s):  
Friction Force ◽  
Lateral Force ◽  
Silicon Sample ◽  
Friction Force Microscopy ◽  
Friction Behavior ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Calibration ◽  
Calibration Techniques ◽  
Ultra High Molecular Weight

A comparison of two lateral force calibration techniques for friction force microscopy is presented. We used methods developed by Ogletree et.al. [1] and Ruan and Bhushan [2] to measure the friction response between the atomic force microscope (AFM) probe and a silicon sample and to obtain lateral force calibration factors. The factors were used to characterize the friction behavior and interfacial shear strength of a silicon nitride (Si3N4) probe-ultra high molecular weight polyethylene (UHMWPE) interface.

Lateral force calibration for atomic force microscope cantilevers using a suspended nanowire

2020 ◽  
Vol 31 (47) ◽  
pp. 475703
Author(s):  
Guangjie Zhang ◽  
Peng Li ◽  
Dawei Wei ◽  
Kui Hu ◽  
Xiaohui Qiu
Keyword(s):  
Atomic Force Microscope ◽  
Lateral Force ◽  
Atomic Force ◽  
Force Calibration

Traceable Lateral Force Calibration (TLFC) for Atomic Force Microscopy

2020 ◽  
Vol 68 (4) ◽  
Author(s):  
Arnab Bhattacharjee ◽  
Nikolay T. Garabedian ◽  
Christopher L. Evans ◽  
David L. Burris
Keyword(s):  
Atomic Force Microscopy ◽  
Lateral Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Calibration
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