J0503-1-1 Two-Dimensional Pressure Measurement with Speckle Pattern Interferometry

2010 ◽  
Vol 2010.7 (0) ◽  
pp. 49-50
Author(s):  
Hiroyuki HIRAHARA ◽  
Yuya TOSHIMA ◽  
Hirofumi KADONO ◽  
Violeta MADJAROVA
1996 ◽  
Vol 7 (12) ◽  
pp. 1740-1747 ◽  
Author(s):  
Andrew J Moore ◽  
Margaret Lucas ◽  
John R Tyrer

2006 ◽  
Vol 326-328 ◽  
pp. 43-46
Author(s):  
Eisaku Umezaki

The two-dimensional deformation of wood with different grains under shearing loads was measured using an electronic speckle pattern interferometry (ESPI) technique. The radical, tangential and end sections of Douglas firs (Pseudotsuga menziesii) were used as specimens. Results revealed that the deformation values significantly vary for every part of the specimens, and the ring directions of earlywood and latewood, which compose the annual rings, have an effect on the two-dimensional deformation of wood.


2004 ◽  
Author(s):  
Miguel Asmad ◽  
Guillermo Baldwin-Olguin ◽  
C. Maczeyzik ◽  
Fernando Mendoza Santoyo ◽  
Carlos Perez-Lopez

2020 ◽  
Vol 27 (6) ◽  
pp. 1528-1538
Author(s):  
Eric M. Dufresne ◽  
Suresh Narayanan ◽  
Ruben Reininger ◽  
Alec R. Sandy ◽  
Larry Lurio

This paper illustrates the use of spatial filtering with a horizontal slit near the source to enlarge the horizontal coherence in an experimental station and produce a diffraction-limited round focus at an insertion device beamline for X-ray photon correlation spectroscopy experiments. Simple expressions are provided to guide the optical layout, and wave propagation simulations confirm their applicability. The two-dimensional focusing performance of Be compound refractive lenses to produce a round diffraction-limited focus at 11 keV capable of generating a high-contrast speckle pattern of an aerogel sample is demonstrated. The coherent scattering patterns have comparable speckle sizes in both horizontal and vertical directions. The focal spot sizes are consistent with hybrid ray-tracing calculations. Producing a two-dimensional focus on the sample can be helpful to resolve speckle patterns with modern pixel array detectors with high visibility. This scheme has now been in use since 2019 for the 8-ID beamline at the Advanced Photon Source, sharing the undulator beam with two separate beamlines, 8-ID-E and 8-ID-I at 7.35 keV, with increased partially coherent flux, reduced horizontal spot sizes on samples, and good speckle contrast.


2001 ◽  
Vol IV.01.1 (0) ◽  
pp. 17-18
Author(s):  
Yuji MATSUZAKI ◽  
Masateru WATANABE ◽  
Tatsuya AOMATSU ◽  
Tadashige IKEDA ◽  
Toshiyuki SASAKI

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