TRACING FISSURE INFORMATION BY SCANNING ELECTRON MICROSCOPY CHARACTERIZATION OF NATURALLY FISSURED SURFACES OF RICE KERNELS

Ultrahigh‐vacuum scanning electron microscopy characterization of the growth of Fe on CaF2/Si(111): Selective nucleation on electron‐beam modified surfaces

Journal of Applied Physics ◽

10.1063/1.357859 ◽

1994 ◽

Vol 76 (12) ◽

pp. 8105-8112 ◽

Cited By ~ 16

Author(s):

K. R. Heim ◽

G. G. Hembree ◽

M. R. Scheinfein

Keyword(s):

Electron Microscopy ◽

Electron Beam ◽

Ultrahigh Vacuum ◽

Modified Surfaces ◽

Scanning electron microscopy characterization of connector failures

10.1109/ecc.1988.12593 ◽

2003 ◽

Author(s):

J.L. Marshall

Keyword(s):

Electron Microscopy ◽

In Situ Scanning Electron Microscopy Characterization of the Mechanism for Li Dendrite Growth

Journal of The Electrochemical Society ◽

10.1149/2.0891608jes ◽

2016 ◽

Vol 163 (8) ◽

pp. A1660-A1665 ◽

Cited By ~ 27

Author(s):

Ching-Yen Tang ◽

Shen J. Dillon

Keyword(s):

Electron Microscopy ◽

Dendrite Growth ◽

Scanning Electron Microscopy Characterization of Aluminized Layer Formation on Ti Alloys

Microscopy and Microanalysis ◽

10.1017/s1431927606061101 ◽

2006 ◽

Vol 12 (S02) ◽

pp. 1058-1059

Author(s):

S Romankov ◽

W Sha ◽

SD Kaloshkin

Keyword(s):

Electron Microscopy ◽

Layer Formation ◽

Ti Alloys ◽

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Scanning Electron Microscopy Characterization of Carbon Steel Fractured by Pressure while Exposed to Cryogenic Temperatures

Microscopy and Microanalysis ◽

10.1017/s1431927610056837 ◽

2010 ◽

Vol 16 (S2) ◽

pp. 1260-1261 ◽

Cited By ~ 1

Author(s):

MW Pendleton ◽

C Mazzella

Keyword(s):

Electron Microscopy ◽

Carbon Steel ◽

Cryogenic Temperatures ◽

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Three-dimensional scanning electron microscopy characterization of the topography of textured polymeric surfaces

Polymer Engineering & Science ◽

10.1002/pen.21691 ◽

2010 ◽

Vol 50 (8) ◽

pp. 1527-1534 ◽

Cited By ~ 2

Author(s):

Sofie Ignell ◽

Ruth Ariño ◽

Giovanna Iannuzzi ◽

Ulf Kleist ◽

Mikael Rigdahl

Keyword(s):

Electron Microscopy ◽

Three Dimensional ◽

Polymeric Surfaces ◽

Atomic Force-, Confocal Laser Scanning-, and Scanning Electron Microscopy Characterization of the Surface Degradation of a Polymer

ACS Symposium Series - Scanning Probe Microscopy of Polymers ◽

10.1021/bk-1998-0694.ch011 ◽

1998 ◽

pp. 194-202 ◽

Cited By ~ 1

Author(s):

Ch. Bourban ◽

J. Mergaert ◽

K. Ruffieux ◽

J. Swings ◽

E. Wintermantel

Keyword(s):

Electron Microscopy ◽

Laser Scanning ◽

Confocal Laser Scanning ◽

Confocal Laser ◽

Atomic Force ◽

Focused ion beam/scanning electron microscopy characterization of cell behavior on polymer micro-/nanopatterned substrates: A study of cell–substrate interactions

Micron ◽

10.1016/j.micron.2006.12.003 ◽

2008 ◽

Vol 39 (2) ◽

pp. 111-116 ◽

Cited By ~ 50

Author(s):

E. Martínez ◽

E. Engel ◽

C. López-Iglesias ◽

C.A. Mills ◽

J.A. Planell ◽

...

Keyword(s):

Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Cell Behavior ◽

Cell Substrate ◽

Scanning electron microscopy characterization of structural features in suspended and non-suspended graphene by customized CVD growth

Diamond and Related Materials ◽

10.1016/j.diamond.2014.11.012 ◽

2015 ◽

Vol 54 ◽

pp. 64-73 ◽

Cited By ~ 13

Author(s):

Jaesung Lee ◽

Xuqian Zheng ◽

Robert C. Roberts ◽

Philip X.-L. Feng

Keyword(s):

Electron Microscopy ◽

Structural Features ◽

Suspended Graphene ◽

Cvd Growth ◽

Scanning electron microscopy characterization of ZnSe single crystals grown by solid-phase recrystallization

Materials Science and Engineering B ◽

10.1016/s0921-5107(00)00523-7 ◽

2000 ◽

Vol 78 (2-3) ◽

pp. 105-108 ◽

Cited By ~ 13

Author(s):

A Urbieta ◽

P Fernández ◽

J Piqueras ◽

V Muñoz

Keyword(s):

Electron Microscopy ◽

Single Crystals ◽

Solid Phase ◽

Phase Recrystallization ◽