Performance of an Automated Digital Gamma–Imaging System Based upon Cadmium Telluride-Complementary Metal-Oxide Semiconductor Sensor and Collimated75Se Source for Nondestructive Testing
2009 ◽
Vol 20
(10)
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pp. 104004
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2018 ◽
Vol 89
(9)
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pp. 093111
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2010 ◽
Vol 49
(1)
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pp. 01AG02
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2007 ◽
Vol 46
(4B)
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pp. 2806-2810
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2017 ◽
Vol 47
(4)
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pp. 233
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2010 ◽
Vol 49
(4)
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pp. 04DL11
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2019 ◽
Vol 25
(7)
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pp. 603-609