Measurements of absorption losses in TiO_2 films by a collinear photothermal deflection technique

1990 ◽  
Vol 29 (28) ◽  
pp. 4276 ◽  
Author(s):  
Mireille Commandré ◽  
Emile Pelletier
Keyword(s):  
Photothermal Deflection

Waveguide loss measurement using photothermal deflection

1988 ◽  
Vol 27 (13) ◽  
pp. 2636 ◽  
Author(s):  
Robert K. Hickernell ◽  
Donald R. Larson ◽  
Robert J. Phelan ◽  
Lee E. Larson
Keyword(s):  
Loss Measurement ◽  
Waveguide Loss ◽  
Photothermal Deflection

Thermo-optical characterization and thermal properties of graphene–polymer composites: a review

2018 ◽  
Vol 6 (12) ◽  
pp. 2901-2914 ◽  
Author(s):  
Reg Bauld ◽  
Dong-Yup William Choi ◽  
Paul Bazylewski ◽  
Ranjith Divigalpitiya ◽  
Giovanni Fanchini
Keyword(s):  
Thermal Properties ◽  
Polymer Composites ◽  
Optical Characterization ◽  
Great Promise ◽  
Thermal Interface Materials ◽  
Thermal Interface ◽  
Photothermal Deflection ◽  
Interface Materials

Graphene–polymer composites show great promise as thermal interface materials. We here offer a deeper understanding of their thermal properties using contactless photothermal deflection techniques.

Effect of laser beam shape parameters on photothermal deflection densitometers

1984 ◽  
Vol 56 (9) ◽  
pp. 1674-1677 ◽  
Author(s):  
Tsuey Ing. Chen ◽  
Michael D. Morris
Keyword(s):  
Laser Beam ◽  
Shape Parameters ◽  
Beam Shape ◽  
Photothermal Deflection

scholarly journals Photothermal Deflection Spectroscopy Study of Nanocrystalline Si (nc-Si) Thin Films Deposited on Porous Aluminum with PECVD

2012 ◽  
Vol 2012 ◽  
pp. 1-5 ◽  
Author(s):  
S. Ktifa ◽  
M. Ghrib ◽  
F. Saadallah ◽  
H. Ezzaouia ◽  
N. Yacoubi
Keyword(s):  
Optical Properties ◽  
Energy Gap ◽  
Chemical Vapor ◽  
Nanocrystalline Silicon ◽  
Porous Aluminum ◽  
Force Microscopy ◽  
Photothermal Deflection Spectroscopy ◽  
Atomic Force ◽  
Photothermal Deflection ◽  
Morphology Characterization

We have studied the optical properties of nanocrystalline silicon (nc-Si) film deposited by plasma enhancement chemical vapor deposition (PECVD) on porous aluminum structure using, respectively, the Photothermal Deflection Spectroscopy (PDS) and Photoluminescence (PL). The aim of this work is to investigate the influence of anodisation current on the optical properties of the porous aluminum silicon layers (PASL). The morphology characterization studied by atomic force microscopy (AFM) technique has shown that the grain size of (nc-Si) increases with the anodisation current. However, a band gap shift of the energy gap was observed.

Trace explosive detection using photothermal deflection spectroscopy

2008 ◽  
Vol 103 (9) ◽  
pp. 094906 ◽  
Author(s):  
Adam R. Krause ◽  
Charles Van Neste ◽  
Larry Senesac ◽  
Thomas Thundat ◽  
Eric Finot
Keyword(s):  
Explosive Detection ◽  
Photothermal Deflection Spectroscopy ◽  
Photothermal Deflection

scholarly journals Hydrogen related effects in a-Si:H studied by photothermal deflection spectroscopy

1991 ◽  
pp. 269-272
Author(s):  
J. Serra ◽  
J. Andreu ◽  
G. Sardin ◽  
C. Roch ◽  
J.M. Asensi ◽  
...  
Keyword(s):  
Photothermal Deflection Spectroscopy ◽  
Photothermal Deflection
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