On-Chip Instantaneous Microwave Frequency Measurement System based on a Waveguide Bragg Grating on Silicon

Author(s):  
Maurizio Burla ◽  
Xu Wang ◽  
Ming Li ◽  
Lukas Chrostowski ◽  
José Azaña
2011 ◽  
Vol 21 (1) ◽  
pp. 52-54 ◽  
Author(s):  
Ze Li ◽  
Chao Wang ◽  
Ming Li ◽  
Hao Chi ◽  
Xianmin Zhang ◽  
...  

2017 ◽  
Vol 382 ◽  
pp. 366-370 ◽  
Author(s):  
Jianfei Jiang ◽  
Haifeng Shao ◽  
Xia Li ◽  
Yan Li ◽  
Tingge Dai ◽  
...  

2020 ◽  
Vol 10 (23) ◽  
pp. 8571
Author(s):  
Nuannuan Shi ◽  
Tengfei Hao ◽  
Wei Li ◽  
Ming Li

A compact multifrequency measurement system based on frequency-to-time mapping technology is proposed and experimentally demonstrated using an integrated frequency scanning signal generator. The relationship between the input microwave frequency and the time difference of a pair of pulses is established to realize the frequency information mapping to the time information. As a main part in the proposed frequency measurement system, the frequency-scanning signal is generated by heterodyning of two lasers with the monolithic integrated laser array, of which one is modulated on a saw-tooth signal. In the proposed frequency measurement system, it can measure single/multiple frequency microwave signals with a large bandwidth for high resolution and flexible tunable measurement range for multifrequency band. In the experimental demonstration, the single frequency measurement errors are less than 90 MHz within the measurement range from 4 to 12 GHz. For two-tone signal, the measurement resolution reaches about 150 MHz.


CLEO: 2014 ◽  
2014 ◽  
Author(s):  
Maurizio Burla ◽  
Luis Romero Cortés ◽  
Ming Li ◽  
Xu Wang ◽  
Lukas Chrostowski ◽  
...  

2015 ◽  
Vol 40 (17) ◽  
pp. 3934 ◽  
Author(s):  
Nikolai N. Klimov ◽  
Sunil Mittal ◽  
Michaela Berger ◽  
Zeeshan Ahmed

Sign in / Sign up

Export Citation Format

Share Document