Comparison between spectral resolved scattering microscopy and collimated transmission measurements

Author(s):  
Michael Schmitz ◽  
Thomas Rothe ◽  
Alwin Kienle
2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Prashanth Gopalan ◽  
Yunshan Wang ◽  
Berardi Sensale-Rodriguez

AbstractWhile terahertz spectroscopy can provide valuable information regarding the charge transport properties in semiconductors, its application for the characterization of low-conductive two-dimensional layers, i.e., σs <  < 1 mS, remains elusive. This is primarily due to the low sensitivity of direct transmission measurements to such small sheet conductivity levels. In this work, we discuss harnessing the extraordinary optical transmission through gratings consisting of metallic stripes to characterize such low-conductive two-dimensional layers. We analyze the geometric tradeoffs in these structures and provide physical insights, ultimately leading to general design guidelines for experiments enabling non-contact, non-destructive, highly sensitive characterization of such layers.


1991 ◽  
Vol 66 (1 Spec No) ◽  
pp. 59-61 ◽  
Author(s):  
J Robinson ◽  
M J Moseley ◽  
A R Fielder ◽  
S C Bayliss

1964 ◽  
Vol 19 (5) ◽  
pp. 548-552
Author(s):  
Günther Harbeke

The absorption constant of germanium beyond the first direct absorption edge has been determined up to energies of 2.5 eV by transmission measurements on very thin samples prepared from bulk single crystals. The results are discussed in terms of recent band structure calculations and previous reflection measurements. At low temperatures the observed structure gives evidence for exciton formation connected with direct transitions at a saddle point in the energy difference between conduction and valence bands.


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