Development of Ice Cloud Microphysical and Optical Models at Visible to Far-Infrared Wavelengths

2005 ◽  
Author(s):  
Bryan A. Baum ◽  
Ping Yang ◽  
Andrew J. Heymsfield
Keyword(s):  
Far Infrared ◽  
Ice Cloud ◽  
Infrared Wavelengths

Improvement of Ice Cloud Optical Models at Visible through Far-Infrared Wavelengths

2009 ◽  
Author(s):  
Bryan A. Baum ◽  
Ping Yang ◽  
Andrew J. Heymsfield
Keyword(s):  
Far Infrared ◽  
Ice Cloud ◽  
Infrared Wavelengths

scholarly journals A test of the ability of current bulk optical models to represent the radiative properties of cirrus cloud across the mid-and far-infrared

2020 ◽  
Author(s):  
Richard J. Bantges ◽  
Helen E. Brindley ◽  
Jonathan E. Murray ◽  
Alan E. Last ◽  
Cathryn Fox ◽  
...  
Keyword(s):  
Compensation Effect ◽  
Far Infrared ◽  
Single Scattering ◽  
Radiative Properties ◽  
Cirrus Cloud ◽  
Atmospheric Measurements ◽  
Infrared Observations ◽  
Ice Cloud ◽  
Infrared Frequency Range ◽  
The Uk

Abstract. Measurements of mid- to far-infrared nadir radiances obtained from the UK Facility for Airborne Atmospheric Measurements (FAAM) BAe-146 aircraft during the Cirrus Coupled Cloud-Radiation Experiment (CIRCCREX) are used to assess the performance of various ice cloud bulk optical (single-scattering) property models. Through use of a minimisation approach, we find that the simulations can reproduce the observed spectra in the mid-infrared to within measurement uncertainty but are unable to simultaneously match the observations over the far-infrared frequency range. When both mid and far-infrared observations are used to minimise residuals, first order estimates of the flux differences between the best performing simulations and observations indicate a strong compensation effect between the mid and far infrared such that the absolute broadband difference is

scholarly journals Infrared-faint radio sources remain undetected at far-infrared wavelengths

2015 ◽  
Vol 580 ◽  
pp. A7 ◽  
Author(s):  
A. Herzog ◽  
R. P. Norris ◽  
E. Middelberg ◽  
L. R. Spitler ◽  
C. Leipski ◽  
...  
Keyword(s):  
Far Infrared ◽  
Radio Sources ◽  
Infrared Wavelengths

scholarly journals Mid- to far-infrared sensing: SrTiO3, a novel optical material

2019 ◽  
Vol 7 (26) ◽  
pp. 7851-7857 ◽  
Author(s):  
N. Kalfagiannis ◽  
J. L. Stoner ◽  
J. Hillier ◽  
I. Vangelidis ◽  
E. Lidorikis
Keyword(s):  
Far Infrared ◽  
Optical Material ◽  
Technological Solution ◽  
Infrared Sensing ◽  
Infrared Wavelengths

SrTiO3 as a disruptive technological solution to the inflated expectations of plasmonics, targeting the mid and far infrared wavelengths.

Far-infrared magnetooptical generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures

2002 ◽  
Vol 744 ◽  
Author(s):  
Tino Hofmann ◽  
Marius Grundmann ◽  
Craig M. Herzinger ◽  
Mathias Schubert ◽  
Wolfgang Grill
Keyword(s):  
Hall Effect ◽  
Dielectric Function ◽  
Far Infrared ◽  
Free Carrier ◽  
Independent Experiment ◽  
Electron Mass ◽  
Effective Electron Mass ◽  
Effective Electron ◽  
Infrared Wavelengths

ABSTRACTIn accord with the Drude model, the free-carrier contribution to the dielectric function at infrared wavelengths is proportional to the ratio of the free-carrier concentration N and the effective mass m*, and the product of the optical mobility μ and m*. Typical infrared optical experiments are therefore sensitive to the free-carrier mass, but determination of m* from the measured dielectric function requires an independent experiment, such as an electrical Hall-effect measurement, which provides either N or μ. Highly-doped zincblende III-V-semiconductors exposed to a strong external magnetic field exhibit non-symmetric magnetooptical birefringence, which is inversely proportional to m*. If the spectral dependence of the magnetooptical dielectric function tensor is known, the parameters N, m* and μ can be determined independently from optical measurements alone. Generalized ellipsometry measures three complex-valued ratios of normalized Jones matrix elements, from which the individual tensor elements of the dielectric function of arbitrarily anisotropic materials in layered samples can be reconstructed. We present the application of generalized ellipsometry to semiconductor layer structures at far-infrared wavelengths, and determine the magnetooptical dielectric function for n-GaAs and n-AlGaInP for wavelengths from 100 μm to 15 μm. We obtain the effective electron mass and mobility results of GaAs in excellent agreement with results obtained from Hall-effect and Shubnikov-de-Haas experiments. The effective electron mass in disordered n-AlGaInP obtained here is in very good agreement with previous k·p calculations. (Far)-infrared magnetooptic generalized ellipsometry may open up new avenues for non-destructive characterization of free-carrier properties in complex semiconductor heterostructures.

Free-standing grids wound from 5 μm diameter wire for spectroscopy at far-infrared wavelengths

1979 ◽  
Vol 19 (5) ◽  
pp. 599-601 ◽  
Author(s):  
P.A.R. Ade ◽  
A.E. Costley ◽  
C.T. Cunningham ◽  
C.L. Mok ◽  
G.F. Neill ◽  
...  
Keyword(s):  
Far Infrared ◽  
Free Standing ◽  
Infrared Wavelengths
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