Transmission of 3×253-Gb/s OFDM-Superchannels over 764 km Field Deployed Single Mode Fibers

2010 ◽  
Author(s):  
Roman Dischler ◽  
Axel Klekamp ◽  
Fred Buchali ◽  
Wilfried Idler ◽  
Eugen Lach ◽  
...  
Keyword(s):  
Single Mode

Post-baking characteristics of single-mode and multimode silver/sodium exchanged waveguides

1989 ◽  
Vol 136 (2) ◽  
pp. 103 ◽  
Author(s):  
P.S. Chung ◽  
M.J. Millington
Keyword(s):  
Single Mode

Interlaboratory evaluation of theoretical modelling techniques for single-mode optical fibres

1992 ◽  
Vol 139 (5) ◽  
pp. 353 ◽  
Author(s):  
J. Pelayo ◽  
J. Paniello ◽  
N. Gisin ◽  
J.W. Burgmeijer ◽  
M. Blondel ◽  
...  
Keyword(s):  
Single Mode ◽  
Theoretical Modelling ◽  
Optical Fibres ◽  
Modelling Techniques

Transient multimode statistics in almost single-mode semiconductor lasers

1993 ◽  
Vol 140 (4) ◽  
pp. 237 ◽  
Author(s):  
A. Valle ◽  
P. Colet ◽  
L. Pesquera ◽  
M.San Miguel
Keyword(s):  
Semiconductor Lasers ◽  
Single Mode

Türkiye'de iller arası göçlerin nodexl ile sosyal ağ analizi

2017 ◽  
Vol 4 (1) ◽  
pp. 82-109 ◽  
Author(s):  
Mustafa Yakar ◽  
Fatma Sert Eteman
Keyword(s):  
Network Structure ◽  
Population Data ◽  
Single Mode ◽  
Turkish Population ◽  
Place Of Birth ◽  
Place Of Residence ◽  
Migration Flow ◽  
Population Structures ◽  
The Republic ◽  
Provincial Scale

Türkiye'de 20.yy'ın ortasından itibaren başlayan iç göçler zamanla kurulan göçmen ağları ile süreklilik kazanmış ve ülke içinde nüfusun kır-kent dağılımını değiştirecek boyutlara erişmiştir. Araştırma, göçün doğum yeri verisinden hareketle ikamet edilen yerdeki nüfus miktarına göre alınan ve verilen göç akışının büyüklüğünü iller ölçeğinde yönlü ağlar kullanılarak analiz edilmesini amaçlamaktadır. Araştırmada, TÜİK tarafından yayınlanmış olan 2015 yılına ait, iller ölçeğinde doğum yerine göre ikamet yeri verisi kullanılmıştır. Göçün kaynak ve hedef sahaları arasındaki akışını incelemek için NodeXL ile oluşturulan tek modlu, yönlü ve ağırlıklandırılmış göç ağının istatistiksel olarak tam ağ yapısına sahip olduğu görülmüştür. Ağ grafiklerinden ve istatistiklerinden göç hareketinin doğudan batıya doğru gerçekleştiği ve İstanbul’ un ülkenin tamamına hâkim bir görünüme sahip olduğu anlaşılmaktadır. Türkiye nüfusunun cumhuriyet tarihi içinde geçirdiği iç göç süreçleriyle birlikte ülke içinde kurulmuş ve oldukça karmaşık bir görünüme sahip ağ yapısının olduğu ileri sürülebilir. Kurulan ağlar göçlerin devamını sağladığı gibi, göçün yöneldiği merkezlerde daha heterojen nüfus yapılarının ortaya çıkmasına yol açmıştır.ABSTRACT IN ENGLISHSocial Network Analysis of Migration Inter Provinces In Turkey with Nodexl The internal migrations which started in Turkey in the middle of the 20th century have gained permanency with the migration networks that were established at the time and reached dimensions which have the potential to change the rural-urban distribution of the population within the country.  The study aims to analyze the magnitude of the incoming and outgoing migration flow at the provincial scale based on the population data for place of birth according to place of residence by using directional networks. Place of residence according to place of birth at the provincial scale data for 2015 published by TÜİK was used in the study. A single mode, directional and weighted migration network created with NodeXL to examine the migration flows between the source and target has a statistically complete network structure. The network graphs and statistics show that the migrations have taken place from east to west and Istanbul has a view as dominant of the country. It can be argued that internal network structure of Turkish population has  a very complex view because of internal migration in the history of the republic. The established networks have enabled the continuation of migration and have manifested as the emergence of more heterogeneous population structures in centers where migration had been directed.

Improvement of Wall Plug Efficiency in Near Infrared Lateral Single-mode LDs at High Temperature

2013 ◽  
Vol 133 (8) ◽  
pp. 1471-1475
Author(s):  
Tetsuya Yagi ◽  
Takuto Maruyama ◽  
Masayuki Kusunoki ◽  
Naoyuki Shimada ◽  
Muneharu Miyashita
Keyword(s):  
High Temperature ◽  
Near Infrared ◽  
Single Mode ◽  
Wall Plug Efficiency

Performance and Reliability of a MEMS-based tunable optical filter operating in the 1565 nm-1525 nm wavelength range

2002 ◽  
Vol 722 ◽  
Author(s):  
T. S. Sriram ◽  
B. Strauss ◽  
S. Pappas ◽  
A. Baliga ◽  
A. Jean ◽  
...  
Keyword(s):  
Silicon Nitride ◽  
Line Width ◽  
Insertion Loss ◽  
Optical Filter ◽  
Single Mode ◽  
Single Mode Fiber ◽  
Reliability Testing ◽  
Silicon Nitride Membrane ◽  
Tunable Optical Filter ◽  
Extensive Performance

AbstractThis paper describes the results of extensive performance and reliability characterization of a silicon-based surface micro-machined tunable optical filter. The device comprises a high-finesse Fabry-Perot etalon with one flat and one curved dielectric mirror. The curved mirror is mounted on an electrostatically actuated silicon nitride membrane tethered to the substrate using silicon nitride posts. A voltage applied to the membrane allows the device to be tuned by adjusting the length of the cavity. The device is coupled optically to an input and an output single mode fiber inside a hermetic package. Extensive performance characterization (over operating temperature range) was performed on the packaged device. Parameters characterized included tuning characteristics, insertion loss, filter line-width and side mode suppression ratio. Reliability testing was performed by subjecting the MEMS structure to a very large number of actuations at an elevated temperature both inside the package and on a test board. The MEMS structure was found to be extremely robust, running trillions of actuations without failures. Package level reliability testing conforming to Telcordia standards indicated that key device parameters including insertion loss, filter line-width and tuning characteristics did not change measurably over the duration of the test.

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