Determination of the evolution of layer thickness errors and interfacial imperfections in ultrathin sputtered Cr/C multilayers using high-resolution transmission electron microscopy
2011 ◽
Vol 19
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pp. 11815
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Hui Jiang
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Alan Michette
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Slawka Pfauntsch
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Zhanshan Wang
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Jingtao Zhu
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1996 ◽
Vol 74
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pp. 309-315
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K. Tillmann
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A. Thust
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M. Lentzen
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P. Swiatek
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A. FÖRSTER
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...
2010 ◽
Vol 108
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pp. 064508
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Maohua Quan
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Fengyun Guo
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Meicheng Li
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Liancheng Zhao
Yoshinori Tokuda
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Takeshi Irimoto
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Naoki Nishikawa
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Yutaro Katsuyama
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Shunsuke Kobayashi
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...
1996 ◽
Vol 62
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pp. 369-372
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D. Stenkamp
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H. P. Strunk
2005 ◽
Vol 90
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pp. 85-89
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Toshihiro Kogure
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Atsuyuki Inoue
2018 ◽
Vol 106
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pp. 48-58
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1996 ◽
Vol 62
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pp. 369-372
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D. Stenkamp
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H. P. Strunk
1995 ◽
Vol 152
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pp. 42-50
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A. Rosenauer
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T. Reisinger
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E. Steinkirchner
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J. Zweck
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W. Gebhardt
1984 ◽
Vol 40
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pp. 581-584
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