Structure determination of diantimony tritin hexasulphide, Sn3Sb2S6, by high-resolution transmission electron microscopy

Acta Crystallographica Section C Crystal Structure Communications ◽

10.1107/s0108270184004960 ◽

1984 ◽

Vol 40 (4) ◽

pp. 581-584 ◽

Author(s):

P. P. K. Smith

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Structure Determination ◽

Transmission Electron

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Determination of segregation, elastic strain and thin-foil relaxation in InxGa-1-x As islands on GaAs(001) by high resolution transmission electron microscopy

Philosophical Magazine Letters ◽

10.1080/095008396180029 ◽

1996 ◽

Vol 74 (5) ◽

pp. 309-315 ◽

Author(s):

K. Tillmann ◽

A. Thust ◽

M. Lentzen ◽

P. Swiatek ◽

A. FÖRSTER ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Elastic Strain ◽

Thin Foil ◽

Transmission Electron

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Determination of interface structure and atomic arrangements for strained InAs/Ga1−xInxSb superlattices by high-resolution transmission electron microscopy

Journal of Applied Physics ◽

10.1063/1.3481098 ◽

2010 ◽

Vol 108 (6) ◽

pp. 064508 ◽

Author(s):

Maohua Quan ◽

Fengyun Guo ◽

Meicheng Li ◽

Liancheng Zhao

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Interface Structure ◽

Transmission Electron

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Direct determination of a topmost atomic layer of (100) surfaces on (La 0.3 Sr 0.7 )(Al 0.65 Ta 0.35 )O 3 single crystals annealed in air by high‐resolution scanning transmission electron microscopy

Surface and Interface Analysis ◽

10.1002/sia.7043 ◽

2021 ◽

Author(s):

Yoshinori Tokuda ◽

Takeshi Irimoto ◽

Naoki Nishikawa ◽

Yutaro Katsuyama ◽

Shunsuke Kobayashi ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Single Crystals ◽

Scanning Transmission Electron Microscopy ◽

Direct Determination ◽

Atomic Layer ◽

Transmission Electron ◽

Scanning Transmission

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Structure determination of chitosan-stabilized Pt and Pd based bimetallic nanoparticles by X-ray photoelectron spectroscopy and transmission electron microscopy

Materials Chemistry and Physics ◽

10.1016/j.matchemphys.2012.09.045 ◽

2012 ◽

Vol 137 (2) ◽

pp. 493-498 ◽

Author(s):

Lihua Wu ◽

Salimah Shafii ◽

Mohd Ridzuan Nordin ◽

Kong Yong Liew ◽

Jinlin Li

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Structure Determination ◽

Photoelectron Spectroscopy ◽

Bimetallic Nanoparticles ◽

X Ray ◽

Transmission Electron

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Crystal structure determination of the Γ2 phase in the Fe–Zn–Al system by single-crystal synchrotron X-ray diffraction combined with scanning transmission electron microscopy

Journal of Alloys and Compounds ◽

10.1016/j.jallcom.2015.04.119 ◽

2015 ◽

Vol 644 ◽

pp. 287-296 ◽

Author(s):

Norihiko L. Okamoto ◽

Haruyuki Inui ◽

Akira Yasuhara ◽

Shu Yamaguchi

Keyword(s):

Crystal Structure ◽

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Structure Determination ◽

Scanning Transmission Electron Microscopy ◽

X Ray Diffraction ◽

X Ray ◽

Transmission Electron ◽

Scanning Transmission

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Determination of the evolution of layer thickness errors and interfacial imperfections in ultrathin sputtered Cr/C multilayers using high-resolution transmission electron microscopy

Optics Express ◽

10.1364/oe.19.011815 ◽

2011 ◽

Vol 19 (12) ◽

pp. 11815 ◽

Author(s):

Hui Jiang ◽

Alan Michette ◽

Slawka Pfauntsch ◽

Zhanshan Wang ◽

Jingtao Zhu ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Layer Thickness ◽

Transmission Electron

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Quantitative determination of defocus, thickness and composition from high-resolution transmission electron microscopy lattice images

Applied Physics A ◽

10.1007/s003390050311 ◽

1996 ◽

Vol 62 (4) ◽

pp. 369-372 ◽

Author(s):

D. Stenkamp ◽

H. P. Strunk

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Quantitative Determination ◽

Transmission Electron ◽

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Determination of defect structures in kaolin minerals by high-resolution transmission electron microscopy (HRTEM)

American Mineralogist ◽

10.2138/am.2005.1603 ◽

2005 ◽

Vol 90 (1) ◽

pp. 85-89 ◽

Author(s):

Toshihiro Kogure ◽

Atsuyuki Inoue

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Defect Structures ◽

Transmission Electron

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UHV transmission electron microscopy structure determination of the Si(111)-(√3 × √3)R30°Au surface

Surface Science ◽

10.1016/0039-6028(95)00739-3 ◽

1995 ◽

Vol 342 (1-3) ◽

pp. 233-249 ◽

Author(s):

Richard Plass ◽

Laurence D. Marks

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Structure Determination ◽

Transmission Electron

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Determination of atomic-scale chemical composition at semiconductor heteroepitaxial interfaces by high-resolution transmission electron microscopy

Micron ◽

10.1016/j.micron.2018.01.003 ◽

2018 ◽

Vol 106 ◽

pp. 48-58 ◽

Author(s):

C. Wen ◽

Y.J. Ma

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Chemical Composition ◽

High Resolution ◽

Atomic Scale ◽

Transmission Electron

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