Nanometric displacement sensor with switchable measuring range using a cylindrical vector beam excited silicon nanoantenna

AbstractThe emergence of cylindrical vector beam (CVB) multiplexing has opened new avenues for high-capacity optical communication. Although several configurations have been developed to couple/separate CVBs, the CVB multiplexer/demultiplexer remains elusive due to lack of effective off-axis polarization control technologies. Here we report a straightforward approach to realize off-axis polarization control for CVB multiplexing/demultiplexing based on a metal–dielectric–metal metasurface. We show that the left- and right-handed circularly polarized (LHCP/RHCP) components of CVBs are independently modulated via spin-to-orbit interactions by the properly designed metasurface, and then simultaneously multiplexed and demultiplexed due to the reversibility of light path and the conservation of vector mode. We also show that the proposed multiplexers/demultiplexers are broadband (from 1310 to 1625 nm) and compatible with wavelength-division-multiplexing. As a proof of concept, we successfully demonstrate a four-channel CVB multiplexing communication, combining wavelength-division-multiplexing and polarization-division-multiplexing with a transmission rate of 1.56 Tbit/s and a bit-error-rate of 10−6 at the receive power of −21.6 dBm. This study paves the way for CVB multiplexing/demultiplexing and may benefit high-capacity CVB communication.

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A Large Measuring Range Profilometer for Three-Dimensional Surface Topography Measurement

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.364-366.750 ◽

2007 ◽

Vol 364-366 ◽

pp. 750-755 ◽

Cited By ~ 1

Author(s):

Xu Dong Yang ◽

Jia Chun Li ◽

Tie Bang Xie

Keyword(s):

Surface Topography ◽

Three Dimensional ◽

Displacement Sensor ◽

Resistance Force ◽

Sampling Point ◽

Measuring Range ◽

3D Surface Topography ◽

Control Circuits ◽

Industrial Control Computer ◽

Zero Offset

A novel profilometer for three-dimensional (3D) surface topography measurement is presented. The profilometer has large measuring range, high precision and small measuring touch force. It is composed of a two-dimensional (2D) displacement sensor, a 3D platform based on vertical scanning, measuring and control circuits and an industrial control computer. When a workpiece is measured, the vertical undulation of the profile at a sampling point leads to a zero offset of the 2D displacement sensor. According to the zero offset, a piezoelectric actuator and a servo motor drive the vertical scanning platform to move vertically to ensure that the lever returns to its balance position. So the non-linear error caused by the rotation of the lever is very small even if the measuring range is large. When the stylus barges up against a steep wall, the horizontal resistance force results in another zero offset of the 2D displacement sensor. If the zero offset exceeds a quota, the vertical scanning platform descends to make the stylus climb the steep wall successfully. According to the theoretical and experimental analysis, the profilometer can measure roughness, profile of sphere, step, groove and other 3D surfaces with curvature precisely.

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