Probe beam size effect on the measurement of the distance between the probe beam and the sample in photothermal deflection

2006 ◽  
Vol 31 (1) ◽  
pp. 44 ◽  
Author(s):  
Jurandir H. Rohling ◽  
Jun Shen ◽  
Jianqin Zhou ◽  
Caikang Elton Gu
1988 ◽  
Vol 64 (1) ◽  
pp. 1-5 ◽  
Author(s):  
E. Legal Lasalle ◽  
F. Lepoutre ◽  
J. P. Roger

2021 ◽  
Author(s):  
Marek Stehlik ◽  
Frank Wagner ◽  
Janis Zideluns ◽  
Fabien Lemarchand ◽  
Julien Lumeau ◽  
...  
Keyword(s):  

1986 ◽  
Vol 64 (9) ◽  
pp. 1265-1268 ◽  
Author(s):  
F. Alan McDonald ◽  
Grover C. Wetsel Jr. ◽  
Georges E. Jamieson

A new method for calculating signals in photothermal beam-deflection imaging is reviewed and applied to the case of vertical interfaces (cracks or other thermal barriers) in opaque solids. The generality of the approach and the effect of finite probe-beam size are emphasized.


1995 ◽  
Vol 67 (4) ◽  
pp. 577-583 ◽  
Author(s):  
Krzysztof Piotrzkowski
Keyword(s):  

1994 ◽  
Vol 48 (9) ◽  
pp. 1054-1075 ◽  
Author(s):  
M. A. Schweitzer ◽  
J. F. Power

Impulse mirage effect/photothermal deflection spectrometry may be used to detect depth-dependent optical absorption in materials, through the time dependence of the probe beam deflection signal occurring in response to sample irradiation with a short excitation pulse. In this work a theoretical expression was derived for the normal and transverse photothermal deflection signals which occur in a sample with homogeneous thermal properties but where optical absorptivity varies with depth from the surface. An analytical solution of moderate simplicity is obtained for several cases of experimental interest, with three-dimensional heat conduction effects included. The depth profile resolution obtained with the mirage effect method is critically dependent on the distance between the sample layer probed and the offset position of the probe beam in the fluid layer above the sample. Saturation conditions and conditions for obtaining optimal depth resolution of continuous and discrete optical profiles are examined in detail.


2013 ◽  
Vol 1526 ◽  
Author(s):  
Esteban A. Domené ◽  
Nélida Mingolo ◽  
Oscar E. Martínez

ABSTRACTIn this work we compare two different detection schemes that are sensitive to the focus shift of a probe beam due to induced surface curvature. The technique on which both detection schemes are based is called ThERM (Thermal Expansion-Recovery Microscopy) and allows the retrieval of the thermal diffusivity at microscopic levels, hence mapping such magnitude over a sample surface. The induced thermal expansion defocuses the probe beam due to the surface deformation (curvature). The dependence of the defocusing with the pump modulation frequency yields the thermal diffusivity of the sample at the impinging location. The explored depth is controlled by the pump beam size. By scanning both beams, a complete map of the thermal diffusivity can be retrieved.


1996 ◽  
Vol 76 (18) ◽  
pp. 3263-3266 ◽  
Author(s):  
K. Melnikov ◽  
V. G. Serbo
Keyword(s):  

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