Coupling between surface plasmon polaritons and transverse electric polarized light via L-shaped nano-apertures

2015 ◽  
Vol 40 (6) ◽  
pp. 978 ◽  
Author(s):  
Jing Yang ◽  
Chuang Hu ◽  
Qiuling Wen ◽  
Chenglong Zhao ◽  
Jiasen Zhang
2021 ◽  
Author(s):  
Mohammad Bagher Heydari

Abstract In this article, an analytical model is proposed for the study of Transverse-electric (TE) surface plasmon polaritons (SPPs) in nonlinear multi-layer graphene-based waveguides. Each graphene sheet has been located between two different Kerr-type layers. As special cases of the general, proposed structure, two new nonlinear graphene-based waveguides are introduced and investigated in this paper. The obtained results show that the propagation properties of these exemplary structures are adjustable via chemical potential and nonlinear coefficients. A large value of the effective index, i.e. neff= 82 is obtained for the chemical potential of 0.15 eV and the nonlinear ratio of 0.8 for the second structure at the frequency of 61 THz. The presented study suggests a novel platform in graphene plasmonics, which can be used for the design of innovative THz devices.


Nanoscale ◽  
2018 ◽  
Vol 10 (11) ◽  
pp. 5097-5104 ◽  
Author(s):  
Tian Zhang ◽  
Maoning Wang ◽  
Yong Yang ◽  
Fei Fan ◽  
Takhee Lee ◽  
...  

TE-polarized light was used to excite on-chip surface plasmon polaritons to achieve both steering and nanofocusing function.


2021 ◽  
Vol 24 (04) ◽  
pp. 436-443
Author(s):  
I.Z. Indutnyi ◽  
◽  
V.I. Mynko ◽  
M.V. Sopinskyy ◽  
V.A. Dan’ko ◽  
...  

The effect of surface plasmon-polaritons (SPPs) excited at the interface between the profiled surface of the silver layer (in the form of a diffraction grating) and the As4Ge30S66 layer on the photostimulated diffusion of silver into chalcogenide has been studied. The gratings with the period a = 519 nm and modulation depth h/a ≈ 0.037 (where h is the grating depth) were formed on chalcogenide photoresist films by using interferential lithography and covered with the 80-nm-thick aluminum layer, 85-nm-thick silver layer, and thin As4Ge30S66 layer. Photostimulated changes in this structure were studied measuring the angular dependences of specular reflection (Rp) of p-polarized light with the wavelength 632.8 nm. It was found that as a result of exposure, “degradation” (broadening, increase in reflection at the minimum) of the minimum in the angular dependence of Rp (which is associated with the SPP resonance) occurs faster, when the samples are irradiated at the angle corresponding to SPP excitation. This observation indicates acceleration of the photostimulated diffusion process in this structure under the plasmon field action.


2011 ◽  
Vol 181 (3) ◽  
pp. 305 ◽  
Author(s):  
V.B. Zon ◽  
B.A. Zon ◽  
V.G. Klyuev ◽  
A.N. Latyshev ◽  
D.A. Minakov ◽  
...  

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