X-ray Total Reflection Fluorescence Analysis of Iron, Copper, Zinc, and Bromine in Human Serum

1988 ◽  
Vol 42 (7) ◽  
pp. 1250-1253 ◽  
Author(s):  
C. T. Yap
Keyword(s):  
Trace Element Analysis ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
Element Analysis ◽  
X Ray ◽  
Iron Copper ◽  
Control Serum ◽  
Human Sera ◽  
Copper Zinc ◽  
Good Agreement

The method of total reflection fluorescence analysis was used to obtain concentrations of iron, copper, zinc, and bromine in human sera. It was first applied to the commercial control-serum preparation known as Seronorm, and the results obtained were in good agreement with quoted values. The method was then used to determine the concentrations of iron, copper, zinc, and bromine in a random sampling of 62 individuals in an essentially Chinese population. The results are discussed. We feel that this is a suitable method for trace-element analysis of blood in an average laboratory. It is rapid, simple, and economical, besides being multielemental and nondestructive and requiring very small quantities—which seems to be a must in pediatrics.

Light Element Analysis with TXRF

1991 ◽  
Vol 35 (B) ◽  
pp. 947-952
Author(s):  
Christina Streli ◽  
Peter Wobrauschek ◽  
Hannes Aiginger
Keyword(s):  
Trace Element Analysis ◽  
Light Element ◽  
Fluorescence Analysis ◽  
Analytical Tool ◽  
Total Reflection ◽  
Light Elements ◽  
Element Analysis ◽  
X Ray ◽  
Background Reduction ◽  
Powerful Analytical Tool

AbstractTotal Reflection X-Ray Fluorescence Analysis (TXRF) has become a powerful analytical tool for trace element analysis. Because of its advantages in excitation and background reduction TXRF has been applied for the analysis of light elements (C,O,F,Na,...). A special Ge(HP) detector offering an ultra thin window in combination with a spectrometer specially designed for the requirements of light element analysis was used. Also a new windowless X-ray tube for efficient excitation of the light elements was tested. The system was checked with standard aqueous solutions; detection limits in the ng range (7 ng for O) are obtained.

Recent Developments and Results in Total Reflection X-ray Fluorescence Analysis

1990 ◽  
Vol 34 ◽  
pp. 1-12 ◽  
Author(s):  
Peter Wobrauschek ◽  
Peter Kregsamer ◽  
Christina Streli ◽  
Hannes Aiginger
Keyword(s):  
Quality Control ◽  
Trace Element Analysis ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
Element Analysis ◽  
X Ray ◽  
Analytical Technique ◽  
Recent Developments ◽  
Working Groups ◽  
Surface Quality Control

AbstractIn the last years Total Reflection X-Ray Fluorescence spectroscopy (TXRF) has shown to be an analytical technique for trace element analysis as well as surface quality control. Detection limits in the range of pg or ng/g (ppb) level in concentration values of aqueous solutions or 1011 -109 atoms/cm2 are achieved with new excitation sources. The range of detectable elements has been extended to low and high 2 elements. Instrumental developments and results of the Atominstitut as well as from some other working groups are presented.

scholarly journals Improvement in a Method for Trace Element Analysis Method Using a Portable Total Reflection X-ray Fluorescence Spectrometer

2019 ◽  
Vol 68 (5) ◽  
pp. 325-332
Author(s):  
Shinsuke KUNIMURA ◽  
Yugo SUGAWARA ◽  
Yoshie TOKUOKA ◽  
Umina AONO ◽  
Taishiro SUGIOKA ◽  
...  
Keyword(s):  
Trace Element ◽  
Trace Element Analysis ◽  
Total Reflection ◽  
Analysis Method ◽  
Element Analysis ◽  
X Ray ◽  
Fluorescence Spectrometer

Semiconductor Surface Characterization by Synchrotron X-ray Fluorescence Analysis

1990 ◽  
Vol 34 ◽  
pp. 23-33 ◽  
Author(s):  
Atsuo Iida
Keyword(s):  
Surface Characterization ◽  
Trace Element Analysis ◽  
Grazing Incidence ◽  
Total Reflection ◽  
Semiconductor Surface ◽  
Semiconductor Wafer ◽  
Element Analysis ◽  
X Ray ◽  
Xrf Analysis ◽  
Incidence Condition

Recently, external X-ray total reflection, or the grazing-incidence condition, is being widely used for the surface characterization in various research fields. Surface X-ray diffraction, or grazing-incidence diffraction/scattering, and total-reflection fluorescence XAFS (X-ray absorption fine structure) are typical, powerful techniques for surface characterization. X-ray fluorescence (XRF) analysis under the total-reflection condition has also been attracting much attention regarding analytical applications. Two types of XRF experiments have been carried out under the grazing-incidence condition. One is trace-element analysis of a dried solution sample or a semiconductor wafer; another is an analysis of the elemental concentration-profile in depth. Both experiments are closely related to each other, and are valuable and promising because of their non-destructive nature and the high precision of XRF analysis.

X-ray fluorescence analysis for trace element analysis in geosciences

1988 ◽  
Vol 70 (1-2) ◽  
pp. 176
Author(s):  
A. Butikewitz ◽  
O. Bohn ◽  
N. Gurker ◽  
P. Ketelsen ◽  
A. Kno¨chel ◽  
...  
Keyword(s):  
Trace Element ◽  
Trace Element Analysis ◽  
Fluorescence Analysis ◽  
Element Analysis ◽  
X Ray
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