Easily testable circuits in Zhegalkin basis in the case of constant faults of type “1” at gate outputs
AbstractWe consider Boolean circuits in Zhegalkin basis and describe all Boolean functions that can be implemented by a circuit admitting a complete fault detection test of length 1 in case of constant faults of type “1” at gate outputs.
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2019 ◽
Vol 29
(1)
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pp. 23-33
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2018 ◽
Vol 28
(6)
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pp. 369-383
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1974 ◽
Vol 32
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pp. 198-199
1978 ◽
Vol 36
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pp. 658-659