Excellent resistive switching properties of atomic layer-deposited Al2O3/HfO2/Al2O3 trilayer structures for non-volatile memory applications
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2016 ◽
Vol 4
(46)
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pp. 10967-10972
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2013 ◽
Vol 39
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pp. S733-S737
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2015 ◽
Vol 147
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pp. 37-40
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2019 ◽
Vol 30
(16)
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pp. 15224-15235
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