Transmission Electron Microscopy of Type 410 Stainless Steels

Author(s):  
J. M. Capenos ◽  
J. J. Hauser ◽  
B. R. Banerjee
2000 ◽  
Vol 652 ◽  
Author(s):  
Aude Taisne ◽  
Brigitte Décamps ◽  
Louisette Priester

ABSTRACTElementary mechanisms of deformation by fatigue in duplex stainless steels bicrystals are studied by transmission electron microscopy (TEM). An attempt is made to correlate the bicrystal macroscopic behaviour with the interphase interface crystallography.


1999 ◽  
Vol 14 (2) ◽  
pp. 390-397 ◽  
Author(s):  
Yong Jun Oh ◽  
Woo Seog Ryu ◽  
Changmo Sung ◽  
Il Hiun Kuk ◽  
Jun Hwa Hong

The precipitates in nitrogen-added type 316L stainless steels (SS) were investigated by transmission electron microscopy (TEM) after thermal aging. Besides carbides (M23C6 and M6C) and intermetallic phases, an unknown phase of an Fe–Mo–Cr(–Si) system n a filmlike morphology precipitated at grain boundaries. In spite of the similarity in ts chemical composition to that of the Laves phase, the phase of the Fe–Mo–Cr(–Si) system exhibited five-, three-, and twofold symmetries, which are generally observed in quasicrystals having icosahedral symmetry. This phase was formed from the intergrowth of small crystalline clusters of the Laves phase. Decreasing the nitrogen content to that of commercial type 316L grade suppressed the formation of the filmlike fivefold phase. This was attributed to the dissipation of small Laves clusters by M23C6 carbides, which increased as a result of the decreased nitrogen content.


Author(s):  
E. Johnson ◽  
A. Johansen ◽  
L. Sarholt-Kristensen ◽  
E. Gerritsen ◽  
J. Politiek ◽  
...  

Cross-sectional transmission electron microscopy (XTEM) has been used to study the microstructure of noble gas implanted austenitic stainless steels, and in particular to analyse the depth distribution of implantation induced martensite in relation to the general radiation damage distribution.Large discs of low-austenitic stainless steels have been ion implanted with noble gases to fluences in the range l.1020 - 1.1021 m-2. Samples of the implanted discs for cross-sectional transmission electron microscopy (XTEM) were made by electroplating the implanted surface with a 3 mm thick layer of nickel, cutting 3 mm discs from the interface and electropolishing the discs to perforation using a Struers TENUPOL immersion jet apparatus.In samples implanted with low fluences (1-1020 m-2) the implantation zone consists of a heavily damaged top layer containing a dense distribution of microscopic noble gas inclusions, which are visible in defocusing phase contrast. The inclusions are ∽ 3-5 nm in diameter, and the smallest inclusions contain noble gas in the solid phase.


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